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Lienert, U., Poulsen, H. F., Honkimäki, V., Schulze, C., Hignette, O. (1999) A focusing multilayer analyser for local diffraction studies. Journal of Synchrotron Radiation, 6 (5). 979-984 doi:10.1107/s0909049599001934

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Reference TypeJournal (article/letter/editorial)
TitleA focusing multilayer analyser for local diffraction studies
JournalJournal of Synchrotron Radiation
AuthorsLienert, U.Author
Poulsen, H. F.Author
Honkimäki, V.Author
Schulze, C.Author
Hignette, O.Author
Year1999 (September 1)Volume6
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049599001934Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8483375Long-form Identifiermindat:1:5:8483375:8
GUID0
Full ReferenceLienert, U., Poulsen, H. F., Honkimäki, V., Schulze, C., Hignette, O. (1999) A focusing multilayer analyser for local diffraction studies. Journal of Synchrotron Radiation, 6 (5). 979-984 doi:10.1107/s0909049599001934
Plain TextLienert, U., Poulsen, H. F., Honkimäki, V., Schulze, C., Hignette, O. (1999) A focusing multilayer analyser for local diffraction studies. Journal of Synchrotron Radiation, 6 (5). 979-984 doi:10.1107/s0909049599001934
In(1999, September) Journal of Synchrotron Radiation Vol. 6 (5) International Union of Crystallography (IUCr)

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Lienert, U., Schulze, C., Honkimäki, V., Tschentscher, Th., Garbe, S., Hignette, O., Horsewell, A., Lingham, M., Poulsen, H. F., Thomsen, N. B., Ziegler, E. (1998) Focusing Optics for High-Energy X-ray Diffraction. Journal of Synchrotron Radiation, 5 (3). 226-231 doi:10.1107/s0909049598001393
Nielsen, S. F., Wolf, A., Poulsen, H. F., Ohler, M., Lienert, U., Owen, R. A. (2000) A conical slit for three-dimensional XRD mapping. Journal of Synchrotron Radiation, 7 (2). 103-109 doi:10.1107/s0909049500000625
Schulze, C., Lienert, U., Hanfland, M., Lorenzen, M., Zontone, F. (1998) Microfocusing of Hard X-rays with Cylindrically Bent Crystal Monochromators. Journal of Synchrotron Radiation, 5 (2). 77-81 doi:10.1107/s0909049597014568
Lienert, U., Poulsen, H. F., Juul Jensen, D., Lauridsen, E. M., Nielsen, S. F., Margulies, L. (2000) Local Structural Characterization within Polycrystalline Bulk Materials by High Energy Synchrotron Radiation. Acta Crystallographica Section A Foundations of Crystallography, 56. doi:10.1107/s0108767300021899
Suortti, P., Buslaps, T., Fajardo, P., Honkimäki, V., Kretzschmer, M., Lienert, U., McCarthy, J. E., Renier, M., Shukla, A., Tschentscher, Th., Meinander, T. (1999) Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF. Journal of Synchrotron Radiation, 6 (2). 69-80 doi:10.1107/s0909049599000291
Materna, Th., Jolie, J., Mondelaers, W., Masschaele, B., Honkimäki, V., Koch, A., Tschentscher, Th. (1999) Uranium-sensitive tomography with synchrotron radiation. Journal of Synchrotron Radiation, 6 (5). 1059-1064 doi:10.1107/s0909049599008444
Nishibori, E., Takata, M., Sakata, M., Shinohara, H. (1998) Structural studies of endohedral metallofullerenes by synchrotron radiation powder diffraction. Journal of Synchrotron Radiation, 5 (3). 977-979 doi:10.1107/s0909049597016816
Schulze, Clemens, Kleuker, Ulf (1998) A bent Laue analyser crystal for Rayleigh-to-Compton computed tomography. Journal of Synchrotron Radiation, 5 (3). 1085-1087 doi:10.1107/s0909049597017251
Honkimäki, Veijo, Suortti, Pekka (2007) Energy-dispersive diffraction with synchrotron radiation and a germanium detector. Journal of Synchrotron Radiation, 14 (4). 331-338 doi:10.1107/s0909049507014744
Suortti, P., Lienert, U., Schulze, C. (1994) Focusing monochromators for high energy synchrotron radiation. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 338 (1). 27-32 doi:10.1016/0168-9002(94)90157-0
Poulsen, H. F., Garbe, S., Lorentzen, T., Juul Jensen, D., Poulsen, F. W., Andersen, N. H., Frello, T., Feidenhans'l, R., Graafsma, H. (1997) Applications of High-Energy Synchrotron Radiation for Structural Studies of Polycrystalline Materials. Journal of Synchrotron Radiation, 4 (3). 147-154 doi:10.1107/s0909049597002021
 
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