Reference Type | Journal (article/letter/editorial) |
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Title | Infrared characterization of UV laser‐induced silicon oxide films |
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Journal | Applied Physics Letters |
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Authors | Slaoui, A. | Author |
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Fogarassy, E. | Author |
White, C. W. | Author |
Siffert, P. | Author |
Year | 1988 (November 7) | Volume | 53 |
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Issue | 19 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.100482Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8484685 | Long-form Identifier | mindat:1:5:8484685:9 |
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GUID | 0 |
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Full Reference | Slaoui, A., Fogarassy, E., White, C. W., Siffert, P. (1988) Infrared characterization of UV laser‐induced silicon oxide films. Applied Physics Letters, 53 (19). 1832-1834 doi:10.1063/1.100482 |
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Plain Text | Slaoui, A., Fogarassy, E., White, C. W., Siffert, P. (1988) Infrared characterization of UV laser‐induced silicon oxide films. Applied Physics Letters, 53 (19). 1832-1834 doi:10.1063/1.100482 |
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In | (1988, November) Applied Physics Letters Vol. 53 (19) AIP Publishing |
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