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Jing, T. W., Ong, N. P., Sandroff, C. J. (1988) Imaging of layered semiconductor clusters by scanning tunneling microscopy: Bi2S3on graphite and gold substrates. Applied Physics Letters, 53 (2). 104-106 doi:10.1063/1.100574

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Reference TypeJournal (article/letter/editorial)
TitleImaging of layered semiconductor clusters by scanning tunneling microscopy: Bi2S3on graphite and gold substrates
JournalApplied Physics Letters
AuthorsJing, T. W.Author
Ong, N. P.Author
Sandroff, C. J.Author
Year1988 (July 11)Volume53
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.100574Search in ResearchGate
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Mindat Ref. ID8484770Long-form Identifiermindat:1:5:8484770:6
GUID0
Full ReferenceJing, T. W., Ong, N. P., Sandroff, C. J. (1988) Imaging of layered semiconductor clusters by scanning tunneling microscopy: Bi2S3on graphite and gold substrates. Applied Physics Letters, 53 (2). 104-106 doi:10.1063/1.100574
Plain TextJing, T. W., Ong, N. P., Sandroff, C. J. (1988) Imaging of layered semiconductor clusters by scanning tunneling microscopy: Bi2S3on graphite and gold substrates. Applied Physics Letters, 53 (2). 104-106 doi:10.1063/1.100574
In(1988, July) Applied Physics Letters Vol. 53 (2) AIP Publishing

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Womelsdorf, J. F., Ermler, W. C., Sandroff, C. J. (1991) Imaging of colloidal gold on graphite by scanning tunneling microscopy: Isolated particles, aggregates, and ordered arrays. The Journal of Physical Chemistry, 95 (2). 503-505 doi:10.1021/j100155a001
Durston, P. J., Palmer, R. E., Wilcoxon, J. P. (1998) Manipulation of passivated gold clusters on graphite with the scanning tunneling microscope. Applied Physics Letters, 72 (2). 176-178 doi:10.1063/1.120677
Variano, B. F., Hwang, D. M., Sandroff, C. J., Wiltzius, P., Jing, T. W., Ong, N. P. (1987) Quantum effects in anisotropic semiconductor clusters: colloidal suspensions of bismuth sesquisulfide and antimony sesquisulfide. The Journal of Physical Chemistry, 91 (26). 6455-6458 doi:10.1021/j100310a006
Leung, M. S., Ives, N. A., Stupian, G. W. (1991) Imaging of polydiacetylene on graphite by scanning tunneling microscopy. Journal of Applied Physics, 69 (4). 2044-2047 doi:10.1063/1.348729
Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Noise reduction technique for scanning tunneling microscopy. Applied Physics Letters, 53 (16). 1503-1505 doi:10.1063/1.99940
Albrecht, T. R., Dovek, M. M., Lang, C. A., GrĂźtter, P., Quate, C. F., Kuan, S. W. J., Frank, C. W., Pease, R. F. W. (1988) Imaging and modification of polymers by scanning tunneling and atomic force microscopy. Journal of Applied Physics, 64 (3). 1178-1184 doi:10.1063/1.341881
Albrecht, T. R., Mizes, H. A., Nogami, J., Park, Sang‐il, Quate, C. F. (1988) Observation of tilt boundaries in graphite by scanning tunneling microscopy and associated multiple tip effects. Applied Physics Letters, 52 (5). 362-364 doi:10.1063/1.99465
Nogami, J., Park, Sang‐il, Quate, C. F. (1988) Behavior of Ga on Si(100) as studied by scanning tunneling microscopy. Applied Physics Letters, 53 (21). 2086-2088 doi:10.1063/1.100289
SĂĄenz, J. J., GarcĂ­a, N., Slonczewski, J. C. (1988) Theory of magnetic imaging by force microscopy. Applied Physics Letters, 53 (15). 1449-1451 doi:10.1063/1.99965
Wilson, I. H., Zheng, N. J., Knipping, U., Tsong, I. S. T. (1988) Scanning tunneling microscopy of an ion‐bombarded PbS(001) surface. Applied Physics Letters, 53 (21). 2039-2041 doi:10.1063/1.100312
van Baarle, G. J. C., Troianovski, A. M., Nishizaki, T., Kes, P. H., Aarts, J. (2003) Imaging of vortex configurations in thin films by scanning-tunneling microscopy. Applied Physics Letters, 82 (7). 1081-1083 doi:10.1063/1.1554481
 
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