Reference Type | Journal (article/letter/editorial) |
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Title | Defect structures in laser‐fused Si‐SiO2wafers |
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Journal | Applied Physics Letters |
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Authors | Geyselaers, M. L. | Author |
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Haisma, J. | Author |
Widdershoven, F. P. | Author |
Michielsen, Th. M. | Author |
Reader, A. H. | Author |
Year | 1989 (April 3) | Volume | 54 |
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Issue | 14 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.101398Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8486191 | Long-form Identifier | mindat:1:5:8486191:9 |
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GUID | 0 |
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Full Reference | Geyselaers, M. L., Haisma, J., Widdershoven, F. P., Michielsen, Th. M., Reader, A. H. (1989) Defect structures in laser‐fused Si‐SiO2wafers. Applied Physics Letters, 54 (14). 1311-1313 doi:10.1063/1.101398 |
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Plain Text | Geyselaers, M. L., Haisma, J., Widdershoven, F. P., Michielsen, Th. M., Reader, A. H. (1989) Defect structures in laser‐fused Si‐SiO2wafers. Applied Physics Letters, 54 (14). 1311-1313 doi:10.1063/1.101398 |
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In | (1989, April) Applied Physics Letters Vol. 54 (14) AIP Publishing |
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