Ishikawa, D., Baron, A. Q. R. (2010) Temperature gradient analyzers for compact high-resolution X-ray spectrometers. Journal of Synchrotron Radiation, 17 (1). 12-24 doi:10.1107/s0909049509043167
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Temperature gradient analyzers for compact high-resolution X-ray spectrometers | ||
Journal | Journal of Synchrotron Radiation | ||
Authors | Ishikawa, D. | Author | |
Baron, A. Q. R. | Author | ||
Year | 2010 (January 1) | Volume | 17 |
Issue | 1 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s0909049509043167Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8486209 | Long-form Identifier | mindat:1:5:8486209:7 |
GUID | 0 | ||
Full Reference | Ishikawa, D., Baron, A. Q. R. (2010) Temperature gradient analyzers for compact high-resolution X-ray spectrometers. Journal of Synchrotron Radiation, 17 (1). 12-24 doi:10.1107/s0909049509043167 | ||
Plain Text | Ishikawa, D., Baron, A. Q. R. (2010) Temperature gradient analyzers for compact high-resolution X-ray spectrometers. Journal of Synchrotron Radiation, 17 (1). 12-24 doi:10.1107/s0909049509043167 | ||
In | (2010, January) Journal of Synchrotron Radiation Vol. 17 (1) International Union of Crystallography (IUCr) |
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