Ishikawa, Daisuke, Ellis, David S., Uchiyama, Hiroshi, Baron, Alfred Q. R. (2015) Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer. Journal of Synchrotron Radiation, 22 (1). 3-9 doi:10.1107/s1600577514021006
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer | ||
Journal | Journal of Synchrotron Radiation | ||
Authors | Ishikawa, Daisuke | Author | |
Ellis, David S. | Author | ||
Uchiyama, Hiroshi | Author | ||
Baron, Alfred Q. R. | Author | ||
Year | 2015 (January 1) | Volume | 22 |
Issue | 1 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s1600577514021006Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8487785 | Long-form Identifier | mindat:1:5:8487785:9 |
GUID | 0 | ||
Full Reference | Ishikawa, Daisuke, Ellis, David S., Uchiyama, Hiroshi, Baron, Alfred Q. R. (2015) Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer. Journal of Synchrotron Radiation, 22 (1). 3-9 doi:10.1107/s1600577514021006 | ||
Plain Text | Ishikawa, Daisuke, Ellis, David S., Uchiyama, Hiroshi, Baron, Alfred Q. R. (2015) Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer. Journal of Synchrotron Radiation, 22 (1). 3-9 doi:10.1107/s1600577514021006 | ||
In | (2015, January) Journal of Synchrotron Radiation Vol. 22 (1) International Union of Crystallography (IUCr) |
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