Reference Type | Journal (article/letter/editorial) |
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Title | Correcting for surface topography in X-ray fluorescence imaging |
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Journal | Journal of Synchrotron Radiation |
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Authors | Geil, E. C. | Author |
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Thorne, R. E. | Author |
Year | 2014 (November 1) | Volume | 21 |
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Issue | 6 |
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Publisher | International Union of Crystallography (IUCr) |
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DOI | doi:10.1107/s160057751401875xSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8487766 | Long-form Identifier | mindat:1:5:8487766:4 |
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GUID | 0 |
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Full Reference | Geil, E. C., Thorne, R. E. (2014) Correcting for surface topography in X-ray fluorescence imaging. Journal of Synchrotron Radiation, 21 (6). 1358-1363 doi:10.1107/s160057751401875x |
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Plain Text | Geil, E. C., Thorne, R. E. (2014) Correcting for surface topography in X-ray fluorescence imaging. Journal of Synchrotron Radiation, 21 (6). 1358-1363 doi:10.1107/s160057751401875x |
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In | (2014, November) Journal of Synchrotron Radiation Vol. 21 (6) International Union of Crystallography (IUCr) |
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