Reference Type | Journal (article/letter/editorial) |
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Title | Defect reduction in strained InxGa1−xAs via growth on GaAs (100) substrates patterned to submicron dimensions |
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Journal | Applied Physics Letters |
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Authors | Guha, S. | Author |
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Madhukar, A. | Author |
Chen, Li | Author |
Year | 1990 (June 4) | Volume | 56 |
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Issue | 23 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.102948Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8490624 | Long-form Identifier | mindat:1:5:8490624:9 |
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GUID | 0 |
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Full Reference | Guha, S., Madhukar, A., Chen, Li (1990) Defect reduction in strained InxGa1−xAs via growth on GaAs (100) substrates patterned to submicron dimensions. Applied Physics Letters, 56 (23). 2304-2306 doi:10.1063/1.102948 |
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Plain Text | Guha, S., Madhukar, A., Chen, Li (1990) Defect reduction in strained InxGa1−xAs via growth on GaAs (100) substrates patterned to submicron dimensions. Applied Physics Letters, 56 (23). 2304-2306 doi:10.1063/1.102948 |
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In | (1990, June) Applied Physics Letters Vol. 56 (23) AIP Publishing |
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