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Paccagnella, A., Callegari, A., Batey, J., Lacey, D. (1990) Properties and thermal stability of the SiO2/GaAs interface with different surface treatments. Applied Physics Letters, 57 (3). 258-260 doi:10.1063/1.104217

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Reference TypeJournal (article/letter/editorial)
TitleProperties and thermal stability of the SiO2/GaAs interface with different surface treatments
JournalApplied Physics Letters
AuthorsPaccagnella, A.Author
Callegari, A.Author
Batey, J.Author
Lacey, D.Author
Year1990 (July 16)Volume57
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.104217Search in ResearchGate
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Mindat Ref. ID8492856Long-form Identifiermindat:1:5:8492856:0
GUID0
Full ReferencePaccagnella, A., Callegari, A., Batey, J., Lacey, D. (1990) Properties and thermal stability of the SiO2/GaAs interface with different surface treatments. Applied Physics Letters, 57 (3). 258-260 doi:10.1063/1.104217
Plain TextPaccagnella, A., Callegari, A., Batey, J., Lacey, D. (1990) Properties and thermal stability of the SiO2/GaAs interface with different surface treatments. Applied Physics Letters, 57 (3). 258-260 doi:10.1063/1.104217
In(1990, July) Applied Physics Letters Vol. 57 (3) AIP Publishing


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