Reference Type | Journal (article/letter/editorial) |
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Title | Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification |
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Journal | Applied Physics Letters |
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Authors | Bragas, A. V. | Author |
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Landi, S. M. | Author |
Martı́nez, O. E. | Author |
Year | 1998 (April 27) | Volume | 72 |
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Issue | 17 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.121280Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8520908 | Long-form Identifier | mindat:1:5:8520908:2 |
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GUID | 0 |
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Full Reference | Bragas, A. V., Landi, S. M., Martı́nez, O. E. (1998) Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Applied Physics Letters, 72 (17). 2075-2077 doi:10.1063/1.121280 |
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Plain Text | Bragas, A. V., Landi, S. M., Martı́nez, O. E. (1998) Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Applied Physics Letters, 72 (17). 2075-2077 doi:10.1063/1.121280 |
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In | (1998, April) Applied Physics Letters Vol. 72 (17) AIP Publishing |
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