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Bragas, A. V., Landi, S. M., Martı́nez, O. E. (1998) Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Applied Physics Letters, 72 (17). 2075-2077 doi:10.1063/1.121280

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Reference TypeJournal (article/letter/editorial)
TitleLaser field enhancement at the scanning tunneling microscope junction measured by optical rectification
JournalApplied Physics Letters
AuthorsBragas, A. V.Author
Landi, S. M.Author
Martı́nez, O. E.Author
Year1998 (April 27)Volume72
Issue17
PublisherAIP Publishing
DOIdoi:10.1063/1.121280Search in ResearchGate
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Mindat Ref. ID8520908Long-form Identifiermindat:1:5:8520908:2
GUID0
Full ReferenceBragas, A. V., Landi, S. M., Martı́nez, O. E. (1998) Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Applied Physics Letters, 72 (17). 2075-2077 doi:10.1063/1.121280
Plain TextBragas, A. V., Landi, S. M., Martı́nez, O. E. (1998) Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Applied Physics Letters, 72 (17). 2075-2077 doi:10.1063/1.121280
In(1998, April) Applied Physics Letters Vol. 72 (17) AIP Publishing


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