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Kazantsev, D., Guttroff, G., Bayer, M., Forchel, A. (1998) Sample temperature measurement in a scanning near-field optical microscope. Applied Physics Letters, 72 (6). 689-691 doi:10.1063/1.120847

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Reference TypeJournal (article/letter/editorial)
TitleSample temperature measurement in a scanning near-field optical microscope
JournalApplied Physics Letters
AuthorsKazantsev, D.Author
Guttroff, G.Author
Bayer, M.Author
Forchel, A.Author
Year1998 (February 9)Volume72
Issue6
PublisherAIP Publishing
DOIdoi:10.1063/1.120847Search in ResearchGate
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Mindat Ref. ID8521552Long-form Identifiermindat:1:5:8521552:4
GUID0
Full ReferenceKazantsev, D., Guttroff, G., Bayer, M., Forchel, A. (1998) Sample temperature measurement in a scanning near-field optical microscope. Applied Physics Letters, 72 (6). 689-691 doi:10.1063/1.120847
Plain TextKazantsev, D., Guttroff, G., Bayer, M., Forchel, A. (1998) Sample temperature measurement in a scanning near-field optical microscope. Applied Physics Letters, 72 (6). 689-691 doi:10.1063/1.120847
In(1998, February) Applied Physics Letters Vol. 72 (6) AIP Publishing

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Guttroff, G., Bayer, M., Forchel, A., Kazantsev, D. V., Zundel, M. K., Eberl, K. (1997) Investigation of Electronic Structure of InP Single Quantum Dots Using Near Field Scanning Optical Spectroscopy. physica status solidi (a), 164 (1). 291-296 doi:10.1002/1521-396x(199711)164:1<291::aid-pssa291>3.0.co;2-t
Kazantsev, D.V, Gippius, N.A, Oshinowo, J, Forchel, A (1998) Direct measurement of photoluminescence spatial distribution near the GaAs/AlGaAs quantum well edge using a scanning near-field optical microscope. Ultramicroscopy, 71 (1). 235-241 doi:10.1016/s0304-3991(97)00116-2
Guttroff, G., Keto, J. M., Shih, C. K., Anselm, A., Streetman, B. G. (1996) A design of reflection scanning nearā€field optical microscope and its application to AlGaAs/GaAs heterostructures. Applied Physics Letters, 68 (25). 3620-3622 doi:10.1063/1.115749
Lapshin, D. A., Letokhov, V. S., Shubeita, G. T., Sekatskii, S. K., Dietler, G. (2002) Direct measurement of the absolute value of the interaction force between the fiber probe and the sample in a scanning near-field optical microscope. Applied Physics Letters, 81 (8). 1503-1505 doi:10.1063/1.1499736
Kazantsev, D.V. (1998) A simple scanning head for scanning near-field optical microscope. Ultramicroscopy, 71 (1). 191-198 doi:10.1016/s0304-3991(97)00117-4
Ghislain, L. P., Elings, V. B. (1998) Near-field scanning solid immersion microscope. Applied Physics Letters, 72 (22). 2779-2781 doi:10.1063/1.121457
Thoma, A., Dekorsy, T. (2008) Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope. Applied Physics Letters, 92 (25). 251103pp. doi:10.1063/1.2949858
Bragas, A. V., Landi, S. M., MartıĢnez, O. E. (1998) Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Applied Physics Letters, 72 (17). 2075-2077 doi:10.1063/1.121280
Vlahacos, C. P., Steinhauer, D. E., Dutta, S. K., Feenstra, B. J., Anlage, Steven M., Wellstood, F. C. (1998) Quantitative topographic imaging using a near-field scanning microwave microscope. Applied Physics Letters, 72 (14). 1778-1780 doi:10.1063/1.121182
Guo, Xiao, Bertling, Karl, Rakić, Aleksandar D. (2021) Optical constants from scattering-type scanning near-field optical microscope. Applied Physics Letters, 118 (4) 41103pp. doi:10.1063/5.0036872
Steinhauer, D. E., Vlahacos, C. P., Dutta, S. K., Feenstra, B. J., Wellstood, F. C., Anlage, Steven M. (1998) Quantitative imaging of sheet resistance with a scanning near-field microwave microscope. Applied Physics Letters, 72 (7). 861-863 doi:10.1063/1.120918
 
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