Reference Type | Journal (article/letter/editorial) |
---|
Title | X-ray characterization of GaN/AlGaN multiple quantum wells for ultraviolet laser diodes |
---|
Journal | Applied Physics Letters |
---|
Authors | Korakakis, D. | Author |
---|
Ludwig, K. F. | Author |
Moustakas, T. D. | Author |
Year | 1998 (March 2) | Volume | 72 |
---|
Issue | 9 |
---|
Publisher | AIP Publishing |
---|
DOI | doi:10.1063/1.120976Search in ResearchGate |
---|
| Generate Citation Formats |
Mindat Ref. ID | 8521696 | Long-form Identifier | mindat:1:5:8521696:7 |
---|
|
GUID | 0 |
---|
Full Reference | Korakakis, D., Ludwig, K. F., Moustakas, T. D. (1998) X-ray characterization of GaN/AlGaN multiple quantum wells for ultraviolet laser diodes. Applied Physics Letters, 72 (9). 1004-1006 doi:10.1063/1.120976 |
---|
Plain Text | Korakakis, D., Ludwig, K. F., Moustakas, T. D. (1998) X-ray characterization of GaN/AlGaN multiple quantum wells for ultraviolet laser diodes. Applied Physics Letters, 72 (9). 1004-1006 doi:10.1063/1.120976 |
---|
In | (1998, March) Applied Physics Letters Vol. 72 (9) AIP Publishing |
---|
These are possibly similar items as determined by title/reference text matching only.