Arguirov, T., Mchedlidze, T., Kittler, M., Rölver, R., Berghoff, B., Först, M., Spangenberg, B. (2006) Residual stress in Si nanocrystals embedded in a SiO2 matrix. Applied Physics Letters, 89 (5). 53111pp. doi:10.1063/1.2260825
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Residual stress in Si nanocrystals embedded in a SiO2 matrix | ||
Journal | Applied Physics Letters | ||
Authors | Arguirov, T. | Author | |
Mchedlidze, T. | Author | ||
Kittler, M. | Author | ||
Rölver, R. | Author | ||
Berghoff, B. | Author | ||
Först, M. | Author | ||
Spangenberg, B. | Author | ||
Year | 2006 (July 31) | Volume | 89 |
Issue | 5 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.2260825Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8552024 | Long-form Identifier | mindat:1:5:8552024:0 |
GUID | 0 | ||
Full Reference | Arguirov, T., Mchedlidze, T., Kittler, M., Rölver, R., Berghoff, B., Först, M., Spangenberg, B. (2006) Residual stress in Si nanocrystals embedded in a SiO2 matrix. Applied Physics Letters, 89 (5). 53111pp. doi:10.1063/1.2260825 | ||
Plain Text | Arguirov, T., Mchedlidze, T., Kittler, M., Rölver, R., Berghoff, B., Först, M., Spangenberg, B. (2006) Residual stress in Si nanocrystals embedded in a SiO2 matrix. Applied Physics Letters, 89 (5). 53111pp. doi:10.1063/1.2260825 | ||
In | (2006, July) Applied Physics Letters Vol. 89 (5) AIP Publishing |
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