Jo, Minseok, Kim, Seonghyun, Lee, Joonmyoung, Jung, Seungjae, Park, Ju-Bong, Jung, Hyung-Suk, Choi, Rino, Hwang, Hyunsang (2010) Characterization of fast charge trapping in bias temperature instability in metal-oxide-semiconductor field effect transistor with high dielectric constant. Applied Physics Letters, 96 (14). 142110pp. doi:10.1063/1.3384999
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterization of fast charge trapping in bias temperature instability in metal-oxide-semiconductor field effect transistor with high dielectric constant | ||
| Journal | Applied Physics Letters | ||
| Authors | Jo, Minseok | Author | |
| Kim, Seonghyun | Author | ||
| Lee, Joonmyoung | Author | ||
| Jung, Seungjae | Author | ||
| Park, Ju-Bong | Author | ||
| Jung, Hyung-Suk | Author | ||
| Choi, Rino | Author | ||
| Hwang, Hyunsang | Author | ||
| Year | 2010 (April 5) | Volume | 96 |
| Issue | 14 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3384999Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8582671 | Long-form Identifier | mindat:1:5:8582671:9 |
| GUID | 0 | ||
| Full Reference | Jo, Minseok, Kim, Seonghyun, Lee, Joonmyoung, Jung, Seungjae, Park, Ju-Bong, Jung, Hyung-Suk, Choi, Rino, Hwang, Hyunsang (2010) Characterization of fast charge trapping in bias temperature instability in metal-oxide-semiconductor field effect transistor with high dielectric constant. Applied Physics Letters, 96 (14). 142110pp. doi:10.1063/1.3384999 | ||
| Plain Text | Jo, Minseok, Kim, Seonghyun, Lee, Joonmyoung, Jung, Seungjae, Park, Ju-Bong, Jung, Hyung-Suk, Choi, Rino, Hwang, Hyunsang (2010) Characterization of fast charge trapping in bias temperature instability in metal-oxide-semiconductor field effect transistor with high dielectric constant. Applied Physics Letters, 96 (14). 142110pp. doi:10.1063/1.3384999 | ||
| In | (2010, April) Applied Physics Letters Vol. 96 (14) AIP Publishing | ||
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