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Shikler, R., Rosenwaks, Y. (2010) Response to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [Appl. Phys. Lett. 96, 216101 (2010)]. Applied Physics Letters, 96 (21). 216102pp. doi:10.1063/1.3431744

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Reference TypeJournal (article/letter/editorial)
TitleResponse to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [Appl. Phys. Lett. 96, 216101 (2010)]
JournalApplied Physics Letters
AuthorsShikler, R.Author
Rosenwaks, Y.Author
Year2010 (May 24)Volume96
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.3431744Search in ResearchGate
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Mindat Ref. ID8583835Long-form Identifiermindat:1:5:8583835:2
GUID0
Full ReferenceShikler, R., Rosenwaks, Y. (2010) Response to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [Appl. Phys. Lett. 96, 216101 (2010)]. Applied Physics Letters, 96 (21). 216102pp. doi:10.1063/1.3431744
Plain TextShikler, R., Rosenwaks, Y. (2010) Response to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [Appl. Phys. Lett. 96, 216101 (2010)]. Applied Physics Letters, 96 (21). 216102pp. doi:10.1063/1.3431744
In(2010, May) Applied Physics Letters Vol. 96 (21) AIP Publishing

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Meoded, T., Shikler, R., Fried, N., Rosenwaks, Y. (1999) Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy. Applied Physics Letters, 75 (16). 2435-2437 doi:10.1063/1.125039
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