Durkan, C., Chu, D. P., Ivry, Y. (2010) Response to “Comment on ‘Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains’ ” [Appl. Phys. Lett. 97, 046101 (2010)]. Applied Physics Letters, 97 (4). 46102pp. doi:10.1063/1.3467006
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Response to “Comment on ‘Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains’ ” [Appl. Phys. Lett. 97, 046101 (2010)] | ||
Journal | Applied Physics Letters | ||
Authors | Durkan, C. | Author | |
Chu, D. P. | Author | ||
Ivry, Y. | Author | ||
Year | 2010 (July 26) | Volume | 97 |
Issue | 4 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3467006Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8589787 | Long-form Identifier | mindat:1:5:8589787:8 |
GUID | 0 | ||
Full Reference | Durkan, C., Chu, D. P., Ivry, Y. (2010) Response to “Comment on ‘Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains’ ” [Appl. Phys. Lett. 97, 046101 (2010)]. Applied Physics Letters, 97 (4). 46102pp. doi:10.1063/1.3467006 | ||
Plain Text | Durkan, C., Chu, D. P., Ivry, Y. (2010) Response to “Comment on ‘Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains’ ” [Appl. Phys. Lett. 97, 046101 (2010)]. Applied Physics Letters, 97 (4). 46102pp. doi:10.1063/1.3467006 | ||
In | (2010, July) Applied Physics Letters Vol. 97 (4) AIP Publishing |
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