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Sun, Hao, Chu, Haibin, Wang, Jinyong, Ding, Lei, Li, Yan (2010) Kelvin probe force microscopy study on nanotriboelectrification. Applied Physics Letters, 96 (8). 83112pp. doi:10.1063/1.3330866

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Reference TypeJournal (article/letter/editorial)
TitleKelvin probe force microscopy study on nanotriboelectrification
JournalApplied Physics Letters
AuthorsSun, HaoAuthor
Chu, HaibinAuthor
Wang, JinyongAuthor
Ding, LeiAuthor
Li, YanAuthor
Year2010 (February 22)Volume96
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.3330866Search in ResearchGate
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Mindat Ref. ID8585920Long-form Identifiermindat:1:5:8585920:3
GUID0
Full ReferenceSun, Hao, Chu, Haibin, Wang, Jinyong, Ding, Lei, Li, Yan (2010) Kelvin probe force microscopy study on nanotriboelectrification. Applied Physics Letters, 96 (8). 83112pp. doi:10.1063/1.3330866
Plain TextSun, Hao, Chu, Haibin, Wang, Jinyong, Ding, Lei, Li, Yan (2010) Kelvin probe force microscopy study on nanotriboelectrification. Applied Physics Letters, 96 (8). 83112pp. doi:10.1063/1.3330866
In(2010, February) Applied Physics Letters Vol. 96 (8) AIP Publishing

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Sabuktagin, Mohammed Shahriar (2010) Comment on “Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy” [Appl. Phys. Lett. 75, 2435 (1999)]. Applied Physics Letters, 96 (21). 216101pp. doi:10.1063/1.3431743
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