Ghaffarzadeh, Khashayar, Nathan, Arokia, Robertson, John, Kim, Sangwook, Jeon, Sanghun, Kim, Changjung, Chung, U-In, Lee, Je-Hun (2010) Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress. Applied Physics Letters, 97 (11). 113504pp. doi:10.1063/1.3480547
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress | ||
| Journal | Applied Physics Letters | ||
| Authors | Ghaffarzadeh, Khashayar | Author | |
| Nathan, Arokia | Author | ||
| Robertson, John | Author | ||
| Kim, Sangwook | Author | ||
| Jeon, Sanghun | Author | ||
| Kim, Changjung | Author | ||
| Chung, U-In | Author | ||
| Lee, Je-Hun | Author | ||
| Year | 2010 (September 13) | Volume | 97 |
| Issue | 11 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3480547Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8586424 | Long-form Identifier | mindat:1:5:8586424:1 |
| GUID | 0 | ||
| Full Reference | Ghaffarzadeh, Khashayar, Nathan, Arokia, Robertson, John, Kim, Sangwook, Jeon, Sanghun, Kim, Changjung, Chung, U-In, Lee, Je-Hun (2010) Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress. Applied Physics Letters, 97 (11). 113504pp. doi:10.1063/1.3480547 | ||
| Plain Text | Ghaffarzadeh, Khashayar, Nathan, Arokia, Robertson, John, Kim, Sangwook, Jeon, Sanghun, Kim, Changjung, Chung, U-In, Lee, Je-Hun (2010) Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress. Applied Physics Letters, 97 (11). 113504pp. doi:10.1063/1.3480547 | ||
| In | (2010, September) Applied Physics Letters Vol. 97 (11) AIP Publishing | ||
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