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Welander, Paul B., McArdle, Timothy J., Eckstein, James N. (2010) Reduced leakage current in Josephson tunnel junctions with codeposited barriers. Applied Physics Letters, 97 (23). 233510pp. doi:10.1063/1.3518983

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Reference TypeJournal (article/letter/editorial)
TitleReduced leakage current in Josephson tunnel junctions with codeposited barriers
JournalApplied Physics Letters
AuthorsWelander, Paul B.Author
McArdle, Timothy J.Author
Eckstein, James N.Author
Year2010 (December 6)Volume97
Issue23
PublisherAIP Publishing
DOIdoi:10.1063/1.3518983Search in ResearchGate
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Mindat Ref. ID8588742Long-form Identifiermindat:1:5:8588742:8
GUID0
Full ReferenceWelander, Paul B., McArdle, Timothy J., Eckstein, James N. (2010) Reduced leakage current in Josephson tunnel junctions with codeposited barriers. Applied Physics Letters, 97 (23). 233510pp. doi:10.1063/1.3518983
Plain TextWelander, Paul B., McArdle, Timothy J., Eckstein, James N. (2010) Reduced leakage current in Josephson tunnel junctions with codeposited barriers. Applied Physics Letters, 97 (23). 233510pp. doi:10.1063/1.3518983
In(2010, December) Applied Physics Letters Vol. 97 (23) AIP Publishing

See Also

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Lhota, James R., Scheuermann, M., Kuo, P. K., Chen, J. T. (1984) Josephson current distribution in two‐dimensional Josephson tunnel junctions. Applied Physics Letters, 44 (2). 255-257 doi:10.1063/1.94689
Welander, Paul B., Eckstein, James N. (2007) Strained single-crystal Al2O3 grown layer by layer on Nb (110) thin films. Applied Physics Letters, 90 (24). 243510pp. doi:10.1063/1.2747675
Klausmeier‐Brown, M. E., Virshup, G. F., Bozovic, I., Eckstein, J. N., Ralls, K. S. (1992) Engineering of ultrathin barriers in highTC, trilayer Josephson junctions. Applied Physics Letters, 60 (22). 2806-2808 doi:10.1063/1.106834
Jillie, D. W., Kroger, H., Smith, L. N., Cukauskas, E. J., Nisenoff, M. (1982) Niobium nitride‐niobium Josephson tunnel junctions with sputtered amorphous silicon barriers. Applied Physics Letters, 40 (8). 747-750 doi:10.1063/1.93214
Costache, M. V., Moodera, J. S. (2010) All magnesium diboride Josephson junctions with MgO and native oxide barriers. Applied Physics Letters, 96 (8). 82508pp. doi:10.1063/1.3332575
Barcikowski, Z. S., Pomeroy, J. M. (2017) Reduced resistance drift in tunnel junctions using confined tunnel barriers. Journal of Applied Physics, 122 (18). 185107pp. doi:10.1063/1.4996497
Shoji, Akira, Aoyagi, Masahiro, Kosaka, Shin, Shinoki, Fujitoshi, Hayakawa, Hisao (1985) Niobium nitride Josephson tunnel junctions with magnesium oxide barriers. Applied Physics Letters, 46 (11). 1098-1100 doi:10.1063/1.95774
Shinoki, F., Shoji, A., Kosaka, S., Takada, S., Hayakawa, H. (1981) Niobium nitride Josephson tunnel junctions with oxidized amorphous silicon barriers. Applied Physics Letters, 38 (4). 285-286 doi:10.1063/1.92308
Kroger, H., Jillie, D. W., Smith, L. N., Phaneuf, L. E., Potter, C. N., Shaw, D. M., Cukauskas, E. J., Nisenoff, M. (1984) Josephson tunnel junctions with chemically vapor deposited polycrystalline germanium barriers. Applied Physics Letters, 44 (5). 562-564 doi:10.1063/1.94803
Jillie, D. W., Kroger, H., Smith, L. N., Cukauskas, E. J., Nisenoff, M. (1982) Erratum: Niobium nitride‐niobium Josephson tunnel junctions with sputtered amorphous silicon barriers [Appl. Phys. Lett. 40, 747 (1982)]. Applied Physics Letters, 41 (9). 897 doi:10.1063/1.93722
Chong, Yonuk, Hadacek, N., Dresselhaus, P. D., Burroughs, C. J., Baek, B., Benz, S. P. (2005) Josephson junctions with nearly superconducting metal silicide barriers. Applied Physics Letters, 87 (22). 222511pp. doi:10.1063/1.2137992
 
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