Fujikura, Hajime, Konno, Taichiro (2018) Roughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy. Applied Physics Letters, 113 (15). 152101pp. doi:10.1063/1.5042572
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Roughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy | ||
Journal | Applied Physics Letters | ||
Authors | Fujikura, Hajime | Author | |
Konno, Taichiro | Author | ||
Year | 2018 (October 8) | Volume | 113 |
Issue | 15 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.5042572Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8654041 | Long-form Identifier | mindat:1:5:8654041:8 |
GUID | 0 | ||
Full Reference | Fujikura, Hajime, Konno, Taichiro (2018) Roughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy. Applied Physics Letters, 113 (15). 152101pp. doi:10.1063/1.5042572 | ||
Plain Text | Fujikura, Hajime, Konno, Taichiro (2018) Roughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy. Applied Physics Letters, 113 (15). 152101pp. doi:10.1063/1.5042572 | ||
In | (2018, October) Applied Physics Letters Vol. 113 (15) AIP Publishing |
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