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Fujikura, Hajime, Konno, Taichiro (2018) Roughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy. Applied Physics Letters, 113 (15). 152101pp. doi:10.1063/1.5042572

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Reference TypeJournal (article/letter/editorial)
TitleRoughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy
JournalApplied Physics Letters
AuthorsFujikura, HajimeAuthor
Konno, TaichiroAuthor
Year2018 (October 8)Volume113
Issue15
PublisherAIP Publishing
DOIdoi:10.1063/1.5042572Search in ResearchGate
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Mindat Ref. ID8654041Long-form Identifiermindat:1:5:8654041:8
GUID0
Full ReferenceFujikura, Hajime, Konno, Taichiro (2018) Roughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy. Applied Physics Letters, 113 (15). 152101pp. doi:10.1063/1.5042572
Plain TextFujikura, Hajime, Konno, Taichiro (2018) Roughening of GaN homoepitaxial surfaces due to step meandering and bunching instabilities and their suppression in hydride vapor phase epitaxy. Applied Physics Letters, 113 (15). 152101pp. doi:10.1063/1.5042572
In(2018, October) Applied Physics Letters Vol. 113 (15) AIP Publishing


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