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Sheeja, D., Tay, B. K., Lau, S. P., Leong, K. W., Lee, C. H. (2002) AN EMPIRICAL RELATION FOR CRITICAL LOAD OF DLC COATINGS PREPARED ON SILICON SUBSTRATES. International Journal of Modern Physics B, 16 (6). 958-962 doi:10.1142/s0217979202010671

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Reference TypeJournal (article/letter/editorial)
TitleAN EMPIRICAL RELATION FOR CRITICAL LOAD OF DLC COATINGS PREPARED ON SILICON SUBSTRATES
JournalInternational Journal of Modern Physics B
AuthorsSheeja, D.Author
Tay, B. K.Author
Lau, S. P.Author
Leong, K. W.Author
Lee, C. H.Author
Year2002 (March 20)Volume16
Issue6
PublisherWorld Scientific Pub Co Pte Lt
DOIdoi:10.1142/s0217979202010671Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8904766Long-form Identifiermindat:1:5:8904766:6
GUID0
Full ReferenceSheeja, D., Tay, B. K., Lau, S. P., Leong, K. W., Lee, C. H. (2002) AN EMPIRICAL RELATION FOR CRITICAL LOAD OF DLC COATINGS PREPARED ON SILICON SUBSTRATES. International Journal of Modern Physics B, 16 (6). 958-962 doi:10.1142/s0217979202010671
Plain TextSheeja, D., Tay, B. K., Lau, S. P., Leong, K. W., Lee, C. H. (2002) AN EMPIRICAL RELATION FOR CRITICAL LOAD OF DLC COATINGS PREPARED ON SILICON SUBSTRATES. International Journal of Modern Physics B, 16 (6). 958-962 doi:10.1142/s0217979202010671
In(2002, March) International Journal of Modern Physics B Vol. 16 (6) World Scientific Pub Co Pte Lt

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