Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Takhar, K, Gomes, U P, Ranjan, K, Rathi, S, Biswas, D (2015) Temperature dependent DC characterization of InAlN/(AlN)/GaN HEMT for improved reliability. IOP Conference Series: Materials Science and Engineering, 73. 12001pp. doi:10.1088/1757-899x/73/1/012001

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleTemperature dependent DC characterization of InAlN/(AlN)/GaN HEMT for improved reliability
JournalIOP Conference Series: Materials Science and Engineering
AuthorsTakhar, KAuthor
Gomes, U PAuthor
Ranjan, KAuthor
Rathi, SAuthor
Biswas, DAuthor
Year2015 (February 17)Volume73
PublisherIOP Publishing
DOIdoi:10.1088/1757-899x/73/1/012001Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9778004Long-form Identifiermindat:1:5:9778004:9
GUID0
Full ReferenceTakhar, K, Gomes, U P, Ranjan, K, Rathi, S, Biswas, D (2015) Temperature dependent DC characterization of InAlN/(AlN)/GaN HEMT for improved reliability. IOP Conference Series: Materials Science and Engineering, 73. 12001pp. doi:10.1088/1757-899x/73/1/012001
Plain TextTakhar, K, Gomes, U P, Ranjan, K, Rathi, S, Biswas, D (2015) Temperature dependent DC characterization of InAlN/(AlN)/GaN HEMT for improved reliability. IOP Conference Series: Materials Science and Engineering, 73. 12001pp. doi:10.1088/1757-899x/73/1/012001
In(n.d.) IOP Conference Series: Materials Science and Engineering Vol. 73. IOP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Gomes, U P, Takhar, K, Ranjan, K, Rathi, S, Biswas, D (2015) A comparative TCAD assessment of III-V channel materials for future high speed and low power logic applications. IOP Conference Series: Materials Science and Engineering, 73. 12002pp. doi:10.1088/1757-899x/73/1/012002
Bala, Vaneeta, Tripathi, S K, Kumar, Ranjan (2015) DFT study of CdS-PVA film. IOP Conference Series: Materials Science and Engineering, 73. 12118pp. doi:10.1088/1757-899x/73/1/012118
Jana, S K, Ghosh, S, Dinara, S M, Das, T D, Biswas, D (2015) Strain Effects on Band Structure of Wurtzite InGaN/GaN Quantum Well on Si Substrate. IOP Conference Series: Materials Science and Engineering, 73. 12151pp. doi:10.1088/1757-899x/73/1/012151
Anuradha, K N, Koushalya, P R, Bhat, S V (2015) Size Dependent Magnetic Properties of Nd0.7Ca0.3MnO3Nanomanganite. IOP Conference Series: Materials Science and Engineering, 73. 12007pp. doi:10.1088/1757-899x/73/1/012007
Nagaraja, K K, Kumar, A Santhosh, Nagaraja, H S (2015) Fabrication and characterization of ZnO/AI/ZnO multilayers by simultaneous DC and RF magnetron sputtering. IOP Conference Series: Materials Science and Engineering, 73. 12071pp. doi:10.1088/1757-899x/73/1/012071
Singh, R, Kaushik, B K, Quamara, J K (2015) Temperature dependent dielectric constant/loss investigations in annealed polyetherimide. IOP Conference Series: Materials Science and Engineering, 73. 12109pp. doi:10.1088/1757-899x/73/1/012109
Stergiou, E, Liarokapis, D, Glavas, E, Angelis, C, Margariti, S V (2019) Reliability study of U-type multistage interconnection networks. IOP Conference Series: Materials Science and Engineering, 575. 12001pp. doi:10.1088/1757-899x/575/1/012001
Sharma, Shivam, Kaur, Gagandeep, Sharma, Naveen K. (2022) Designing of Higher-Order Series-Parallel resonant converter with improved ZVS under variable source condition for constant DC-bus System. IOP Conference Series: Materials Science and Engineering, 1228 (1) 12001pp. doi:10.1088/1757-899x/1228/1/012001
Fezi, K, Krane, M J M (2015) Uncertainty Quantification in Solidification Modelling. IOP Conference Series: Materials Science and Engineering, 84. 12001pp. doi:10.1088/1757-899x/84/1/012001
Ganta, Rangababu, Ghosh, Saptarsi, Biswas, Dhrubes (2015) Novel Analytical model for current-voltage characteristics and transconductance of undoped AlGaN/GaN MISHFETs and performance comparison with different high-k dielectrics. IOP Conference Series: Materials Science and Engineering, 73. 12144pp. doi:10.1088/1757-899x/73/1/012144
Sharma, Devina, Kumar, Ranjan, Awana, V P S (2015) Effect of sintering temperature on the nature of weak links and flux pinning mechanism in La1.85Sr0.15CuO4superconductor. IOP Conference Series: Materials Science and Engineering, 73. 12030pp. doi:10.1088/1757-899x/73/1/012030
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Β© OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 22, 2025 05:59:34
Go to top of page