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Singh, R, Kaushik, B K, Quamara, J K (2015) Temperature dependent dielectric constant/loss investigations in annealed polyetherimide. IOP Conference Series: Materials Science and Engineering, 73. 12109pp. doi:10.1088/1757-899x/73/1/012109

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Reference TypeJournal (article/letter/editorial)
TitleTemperature dependent dielectric constant/loss investigations in annealed polyetherimide
JournalIOP Conference Series: Materials Science and Engineering
AuthorsSingh, RAuthor
Kaushik, B KAuthor
Quamara, J KAuthor
Year2015 (February 17)Volume73
PublisherIOP Publishing
DOIdoi:10.1088/1757-899x/73/1/012109Search in ResearchGate
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Mindat Ref. ID9778112Long-form Identifiermindat:1:5:9778112:7
GUID0
Full ReferenceSingh, R, Kaushik, B K, Quamara, J K (2015) Temperature dependent dielectric constant/loss investigations in annealed polyetherimide. IOP Conference Series: Materials Science and Engineering, 73. 12109pp. doi:10.1088/1757-899x/73/1/012109
Plain TextSingh, R, Kaushik, B K, Quamara, J K (2015) Temperature dependent dielectric constant/loss investigations in annealed polyetherimide. IOP Conference Series: Materials Science and Engineering, 73. 12109pp. doi:10.1088/1757-899x/73/1/012109
In(n.d.) IOP Conference Series: Materials Science and Engineering Vol. 73. IOP Publishing

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