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Tomov, I., Yamakov, V. (2000) X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction. Materials Science Forum, 321. 137-143 doi:10.4028/www.scientific.net/msf.321-324.137

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Reference TypeJournal (article/letter/editorial)
TitleX-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction
JournalMaterials Science Forum
AuthorsTomov, I.Author
Yamakov, V.Author
Year2000 (January)Volume321
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.321-324.137Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9848897Long-form Identifiermindat:1:5:9848897:1
GUID0
Full ReferenceTomov, I., Yamakov, V. (2000) X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction. Materials Science Forum, 321. 137-143 doi:10.4028/www.scientific.net/msf.321-324.137
Plain TextTomov, I., Yamakov, V. (2000) X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction. Materials Science Forum, 321. 137-143 doi:10.4028/www.scientific.net/msf.321-324.137
In(2000) Materials Science Forum Vol. 321. Trans Tech Publications, Ltd.

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Tomov, I., Adamik, M., Barna, P.B. (2000) Texture and Secondary Extinction of Vacuum Deposited Ag Films. Materials Science Forum, 321. 400-405 doi:10.4028/www.scientific.net/msf.321-324.400
Tomov, I. (1998) Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction. Materials Science Forum, 273. 145-150 doi:10.4028/www.scientific.net/msf.273-275.145
Tomov, I. (2004) Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films. Materials Science Forum, 443. 141-144 doi:10.4028/www.scientific.net/msf.443-444.141
Tomov, I. (2005) Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption. Materials Science Forum, 495. 99-104 doi:10.4028/www.scientific.net/msf.495-497.99
Tomov, I. (2001) Anisotropy of Secondary Extinction Coefficient in Textured Films. Materials Science Forum, 378. 192-199 doi:10.4028/www.scientific.net/msf.378-381.192
Yamakov, V., Tomov, I. (1999) Secondary extinction in textured films. Journal of Applied Crystallography, 32 (2). 300-308 doi:10.1107/s0021889898013387
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Ivanov, A.N., Klimanek, P., Polyakov, A.M. (2000) Extinction Study of Dislocations (Bragg Diffraction). Materials Science Forum, 321. 87-91 doi:10.4028/www.scientific.net/msf.321-324.87
Barmin, Yu., Doonichev, I., Kosilov, A.T. (2000) X-Ray Diffraction Study of the Structure Ti1-xNix Amorpous Alloys. Materials Science Forum, 321. 507-512 doi:10.4028/www.scientific.net/msf.321-324.507
Yagodkin, Yu.D., Vekilova, G.V., Mungalov, R.S. (2000) X-Ray Diffraction Method of Grain Size Measurement. Materials Science Forum, 321. 133-136 doi:10.4028/www.scientific.net/msf.321-324.133
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