Reference Type | Journal (article/letter/editorial) |
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Title | X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder |
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Journal | Materials Science Forum |
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Authors | Kimmel, Giora | Author |
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Dayan, David | Author |
Zabicky, Jacob | Author |
Year | 2000 (January) | Volume | 321 |
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Publisher | Trans Tech Publications, Ltd. |
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DOI | doi:10.4028/www.scientific.net/msf.321-324.762Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9849012 | Long-form Identifier | mindat:1:5:9849012:5 |
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GUID | 0 |
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Full Reference | Kimmel, Giora, Dayan, David, Zabicky, Jacob (2000) X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder. Materials Science Forum, 321. 762-767 doi:10.4028/www.scientific.net/msf.321-324.762 |
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Plain Text | Kimmel, Giora, Dayan, David, Zabicky, Jacob (2000) X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder. Materials Science Forum, 321. 762-767 doi:10.4028/www.scientific.net/msf.321-324.762 |
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In | (2000) Materials Science Forum Vol. 321. Trans Tech Publications, Ltd. |
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