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Vassilevski, Konstantin, Zekentes, Konstantinos, Konstantinidis, George, Papanicolaou, N., Nikitina, Irina P., Babanin, A.I. (2000) Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions. Materials Science Forum, 338. 1017-1020 doi:10.4028/www.scientific.net/msf.338-342.1017

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Reference TypeJournal (article/letter/editorial)
TitleStructural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions
JournalMaterials Science Forum
AuthorsVassilevski, KonstantinAuthor
Zekentes, KonstantinosAuthor
Konstantinidis, GeorgeAuthor
Papanicolaou, N.Author
Nikitina, Irina P.Author
Babanin, A.I.Author
Year2000 (May)Volume338
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.338-342.1017Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9849573Long-form Identifiermindat:1:5:9849573:1
GUID0
Full ReferenceVassilevski, Konstantin, Zekentes, Konstantinos, Konstantinidis, George, Papanicolaou, N., Nikitina, Irina P., Babanin, A.I. (2000) Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions. Materials Science Forum, 338. 1017-1020 doi:10.4028/www.scientific.net/msf.338-342.1017
Plain TextVassilevski, Konstantin, Zekentes, Konstantinos, Konstantinidis, George, Papanicolaou, N., Nikitina, Irina P., Babanin, A.I. (2000) Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions. Materials Science Forum, 338. 1017-1020 doi:10.4028/www.scientific.net/msf.338-342.1017
In(2000) Materials Science Forum Vol. 338. Trans Tech Publications, Ltd.

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Kayambaki, M., Zekentes, Konstantinos (2000) Electrochemical C-V Profiling of P-type 6H-SiC. Materials Science Forum, 338. 1061-1064 doi:10.4028/www.scientific.net/msf.338-342.1061
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Kalinina, Evgenia V., Zubrilov, A.S., Kuznetsov, N.I., Nikitina, Irina P., Tregubova, Alla S., Shcheglov, M.P., Bratus, V.Ya. (2000) Structural, Electrical and Optical Properties of Bulk 4H and 6H p-Type SiC. Materials Science Forum, 338. 497-500 doi:10.4028/www.scientific.net/msf.338-342.497
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Liu, Sam, Potts, Gregory, Scofield, James D. (2000) Thermal Stability in Vacuum and in Air of Al/Ni/W Based Ohmic Contacts to p-Type SiC. Materials Science Forum, 338. 1021-1024 doi:10.4028/www.scientific.net/msf.338-342.1021
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