Reference Type | Journal (article/letter/editorial) |
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Title | Optimazation of the parameters involved in the photochemical doping of Si with a pulsed ArF excimer laser |
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Journal | Applied Surface Science |
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Authors | Foulon, F. | Author |
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Slaoui, A. | Author |
Fogarassy, E. | Author |
Stuck, R. | Author |
Fuchs, C. | Author |
Siffert, P. | Author |
Year | 1989 (January) | Volume | 36 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(89)90933-1Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9894623 | Long-form Identifier | mindat:1:5:9894623:5 |
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GUID | 0 |
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Full Reference | Foulon, F., Slaoui, A., Fogarassy, E., Stuck, R., Fuchs, C., Siffert, P. (1989) Optimazation of the parameters involved in the photochemical doping of Si with a pulsed ArF excimer laser. Applied Surface Science, 36. 384-393 doi:10.1016/0169-4332(89)90933-1 |
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Plain Text | Foulon, F., Slaoui, A., Fogarassy, E., Stuck, R., Fuchs, C., Siffert, P. (1989) Optimazation of the parameters involved in the photochemical doping of Si with a pulsed ArF excimer laser. Applied Surface Science, 36. 384-393 doi:10.1016/0169-4332(89)90933-1 |
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In | (n.d.) Applied Surface Science Vol. 36. Elsevier BV |
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