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Nishikawa, Kouichi, Nishiuchi, Takeshi, Yamamoto, Masahiko, Nishikawa, Osamu (1996) Observation of both Ni and Mo atom images by FIM with imaging plates. Applied Surface Science, 94. 295-299 doi:10.1016/0169-4332(95)00390-8

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Reference TypeJournal (article/letter/editorial)
TitleObservation of both Ni and Mo atom images by FIM with imaging plates
JournalApplied Surface Science
AuthorsNishikawa, KouichiAuthor
Nishiuchi, TakeshiAuthor
Yamamoto, MasahikoAuthor
Nishikawa, OsamuAuthor
Year1996 (March)Volume94
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(95)00390-8Search in ResearchGate
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Mindat Ref. ID9898139Long-form Identifiermindat:1:5:9898139:9
GUID0
Full ReferenceNishikawa, Kouichi, Nishiuchi, Takeshi, Yamamoto, Masahiko, Nishikawa, Osamu (1996) Observation of both Ni and Mo atom images by FIM with imaging plates. Applied Surface Science, 94. 295-299 doi:10.1016/0169-4332(95)00390-8
Plain TextNishikawa, Kouichi, Nishiuchi, Takeshi, Yamamoto, Masahiko, Nishikawa, Osamu (1996) Observation of both Ni and Mo atom images by FIM with imaging plates. Applied Surface Science, 94. 295-299 doi:10.1016/0169-4332(95)00390-8
In(n.d.) Applied Surface Science Vol. 94. Elsevier BV

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Yamamoto, Masahiko, Nishikawa, Kouichi, Nishiuchi, Takeshi (1995) Quantitative analysis of individual atom images in FIM of an ordered Ni4Mo alloy. Applied Surface Science, 87. 291-297 doi:10.1016/0169-4332(94)00500-1
Yamamoto, Masahiko, Takeshita, Yukiteru, Tada, Jun, Nishikawa, Kouichi (1994) An FIM/TEM study of ordered precipitates in a Ni-Mo-Al alloy. Applied Surface Science, 76. 184-190 doi:10.1016/0169-4332(94)90341-7
Nishikawa, Osamu, Akimoto, Taizo, Tsuchiya, Tohru, Yoshimura, Toshihiko, Ishikawa, Yuuichi (1994) Field ion microscope with photostimulable phosphor screen — new approach for quantitative analysis of FIM images-. Applied Surface Science, 76. 359-366 doi:10.1016/0169-4332(94)90368-9
Ashino, Makoto, Tomitori, Masahiko, Nishikawa, Osamu (1995) Atom probe and field emission electron spectroscopy studies of semiconductor films on metals. Applied Surface Science, 87. 12-17 doi:10.1016/0169-4332(94)00521-4
Ashino, Makoto, Tomitori, Masahiko, Nishikawa, Osamu (1993) Atom-probe and field emission electron spectroscope studies of Ge on Ir. Applied Surface Science, 67. 43-47 doi:10.1016/0169-4332(93)90292-j
Nishikawa, Osamu, Kimoto, Masahiro (1994) Toward a scanning atom probe — computer simulation of electric field -. Applied Surface Science, 76. 424-430 doi:10.1016/0169-4332(94)90376-x
Ashino, Makoto, Tomitori, Masahiko, Nishikawa, Osamu (1994) Atom-probe and field emission electron spectroscopy studies of ordered structures and electronic properties of Ge overlayers on Ir-tips. Applied Surface Science, 76. 291-296 doi:10.1016/0169-4332(94)90357-3
Nishikawa, Kouichi, Yamamoto, Masahiko, Kingetsu, Toshiki (1997) Dependence of electrical resistivity on surface topography of MBE-grown Pt film. Applied Surface Science, 113. 412-416 doi:10.1016/s0169-4332(96)00938-5
Yamamoto, Masahiko, Nishikawa, Kouichi, Kingetsu, Toshiki, Kurumizawa, Toshimitu, Kusao, Kenji (1993) Topography and crystallography of a Pt film on a Cu buffer layer and a Si(111)(7 × 7) substrate. Applied Surface Science, 67. 275-280 doi:10.1016/0169-4332(93)90325-6
Nishikawa, Osamu, Yasuoka, Manabu (1979) FIM observation of A Ga(3 × 3) superstructure on W and Mo(011). Surface Science, 87 (1). doi:10.1016/0039-6028(79)90182-1
Nishikawa, Kouichi, Yamamoto, Masahiko, Kingetsu, Toshiki (1998) Step distribution in the Si(111) surface and its effect on microstructure of MBE-grown single- and multi-layered films. Applied Surface Science, 130. 54-59 doi:10.1016/s0169-4332(98)00024-5
 
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