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Vázquez, A., Pedraza, F. (1996) High resolution electron microscopy characterization of small particles in oxide-reducing cycles. Applied Surface Science, 99. 213-220 doi:10.1016/0169-4332(95)00607-9

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Reference TypeJournal (article/letter/editorial)
TitleHigh resolution electron microscopy characterization of small particles in oxide-reducing cycles
JournalApplied Surface Science
AuthorsVázquez, A.Author
Pedraza, F.Author
Year1996 (July)Volume99
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(95)00607-9Search in ResearchGate
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Mindat Ref. ID9898376Long-form Identifiermindat:1:5:9898376:8
GUID0
Full ReferenceVázquez, A., Pedraza, F. (1996) High resolution electron microscopy characterization of small particles in oxide-reducing cycles. Applied Surface Science, 99. 213-220 doi:10.1016/0169-4332(95)00607-9
Plain TextVázquez, A., Pedraza, F. (1996) High resolution electron microscopy characterization of small particles in oxide-reducing cycles. Applied Surface Science, 99. 213-220 doi:10.1016/0169-4332(95)00607-9
In(n.d.) Applied Surface Science Vol. 99. Elsevier BV

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