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Kasrai, M., Lennard, W.N., Brunner, R.W., Bancroft, G.M., Bardwell, J.A., Tan, K.H. (1996) Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy. Applied Surface Science, 99. 303-312 doi:10.1016/0169-4332(96)00454-0

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Reference TypeJournal (article/letter/editorial)
TitleSampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy
JournalApplied Surface Science
AuthorsKasrai, M.Author
Lennard, W.N.Author
Brunner, R.W.Author
Bancroft, G.M.Author
Bardwell, J.A.Author
Tan, K.H.Author
Year1996 (August)Volume99
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(96)00454-0Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9898392Long-form Identifiermindat:1:5:9898392:6
GUID0
Full ReferenceKasrai, M., Lennard, W.N., Brunner, R.W., Bancroft, G.M., Bardwell, J.A., Tan, K.H. (1996) Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy. Applied Surface Science, 99. 303-312 doi:10.1016/0169-4332(96)00454-0
Plain TextKasrai, M., Lennard, W.N., Brunner, R.W., Bancroft, G.M., Bardwell, J.A., Tan, K.H. (1996) Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy. Applied Surface Science, 99. 303-312 doi:10.1016/0169-4332(96)00454-0
In(n.d.) Applied Surface Science Vol. 99. Elsevier BV

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Kasrai, M., Brown, J.R., Bancroft, G.M., Yin, Z., Tan, K.H. (1996) Sulphur characterization in coal from X-ray absorption near edge spectroscopy. International Journal of Coal Geology, 32 (1) 107-135 doi:10.1016/s0166-5162(96)00033-x
Rodríguez-Fernández, L., Lennard, W.N., Xia, H., Massoumi, G.R. (1996) SPIX: a new technique for quantitative surface spectroscopy applied to. Applied Surface Science, 103. 289-298 doi:10.1016/0169-4332(96)00528-4
Li, Dien, Bancroft, G.M., Kasrai, M., Fleet, M.E., Yang, B.X., Feng, X.H., Tan, K., Peng, Mingsheng (1994) Sulfur K- and L-edge X-ray absorption spectroscopy of sphalerite, chalcopyrite and stannite. Physics and Chemistry of Minerals, 20 (7) doi:10.1007/bf00203219
Li, D., Bancroft, G.M., Kasrai, M., Fleet, M.E., Feng, X.H., Yang, B.X., Tan, K.H. (1994) S K- and L-edge XANES and electronic structure of some copper sulfide minerals. Physics and Chemistry of Minerals, 21 (5) doi:10.1007/bf00202096
Brunner, K., Eberl, K., Winter, W., Bugiel, E. (1996) Growth and characterization of Ge1 − yCy/Si superlattice structures on Si substrates. Applied Surface Science, 102. 17-21 doi:10.1016/0169-4332(96)00011-6
Yamada, Kenji, Nishigaki, Satoshi (1996) Oxidation of a Si(001) surface mediated by repetitive adsorption/desorption cycles of Cs: a metastable deexcitation spectroscopy study. Applied Surface Science, 99. 21-26 doi:10.1016/0169-4332(95)00454-8
Li, D., Bancroft, G.M., Kasrai, M., Fleet, M.E., Secco, R.A., Feng,X.H., Tan, K.H., and Yang, B.X. (1994): X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs: the structural characterization of opal. American Mineralogist: 79: 622-632.
Le, H.C, Dreyfus, R.W., Marine, W., Sentis, M., Movtchan, I.A (1996) Temperature measurements during laser ablation of Si into He, Ar and O 2. Applied Surface Science, 96. 164-169 doi:10.1016/0169-4332(95)00473-4
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Colace, L., DiVergilio, A., Vaidyanathan, S., Pearsall, T.P., Presting, H., Kasper, Erich (1996) Photocurrent spectroscopy measurements of Siî—¸Ge alloys and superlattices. Applied Surface Science, 102. 272-278 doi:10.1016/0169-4332(96)00063-3
 
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