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Chen, W.D., Cui, Y.D. (1996) Determination of AlxGa1−xAs Auger sensitivity factors. Applied Surface Science, 100. 156-159 doi:10.1016/0169-4332(96)00277-2

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of AlxGa1−xAs Auger sensitivity factors
JournalApplied Surface Science
AuthorsChen, W.D.Author
Cui, Y.D.Author
Year1996 (July)Volume100
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(96)00277-2Search in ResearchGate
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Mindat Ref. ID9898460Long-form Identifiermindat:1:5:9898460:6
GUID0
Full ReferenceChen, W.D., Cui, Y.D. (1996) Determination of AlxGa1−xAs Auger sensitivity factors. Applied Surface Science, 100. 156-159 doi:10.1016/0169-4332(96)00277-2
Plain TextChen, W.D., Cui, Y.D. (1996) Determination of AlxGa1−xAs Auger sensitivity factors. Applied Surface Science, 100. 156-159 doi:10.1016/0169-4332(96)00277-2
In(n.d.) Applied Surface Science Vol. 100. Elsevier BV

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Chen, W.D., Li, X.Q., Duan, L.H., Xie, X.L., Cui, Y.D. (1996) Photoluminescence enhancement of (NH4)2Sx passivated InP surface by rapid thermal annealing. Applied Surface Science, 100. 592-595 doi:10.1016/0169-4332(96)00345-5
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