Vote for your favorite mineral in #MinCup25! - Stibnite vs. Perovskite
It's all about how minerals interact with humans as dramatic #stibnite faces off against futuristic #perovskite.
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Jo, Masatoshi, Tanaka, Akihiro (1996) Auger electron peaks of Cu in XPS. Applied Surface Science, 100. 11-14 doi:10.1016/0169-4332(96)00247-4

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleAuger electron peaks of Cu in XPS
JournalApplied Surface Science
AuthorsJo, MasatoshiAuthor
Tanaka, AkihiroAuthor
Year1996 (July)Volume100
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(96)00247-4Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9898431Long-form Identifiermindat:1:5:9898431:4
GUID0
Full ReferenceJo, Masatoshi, Tanaka, Akihiro (1996) Auger electron peaks of Cu in XPS. Applied Surface Science, 100. 11-14 doi:10.1016/0169-4332(96)00247-4
Plain TextJo, Masatoshi, Tanaka, Akihiro (1996) Auger electron peaks of Cu in XPS. Applied Surface Science, 100. 11-14 doi:10.1016/0169-4332(96)00247-4
In(n.d.) Applied Surface Science Vol. 100. Elsevier BV

See Also

These are possibly similar items as determined by title/reference text matching only.

Takeichi, Y., Goto, K., Gaidarova, V. (1996) True Auger spectral shapes (standards). Applied Surface Science, 100. 25-29 doi:10.1016/0169-4332(96)00250-4
Suzuki, M., Mogi, K., Takenaka, H. (1996) Auger electron spectroscopy measurement of electron attenuation lengths using multilayer systems. Applied Surface Science, 100. 51-55 doi:10.1016/0169-4332(96)00255-3
Tougaard, Sven (1996) Quantitative XPS: non-destructive analysis of surface nano-structures. Applied Surface Science, 100. 1-10 doi:10.1016/0169-4332(96)00246-2
Chen, W.D., Cui, Y.D. (1996) Determination of AlxGa1−xAs Auger sensitivity factors. Applied Surface Science, 100. 156-159 doi:10.1016/0169-4332(96)00277-2
Sekine, Tetsu, Ikeo, Nobuyuki, Nagasawa, Yuji (1996) Comparison of AES chemical shifts with XPS chemical shifts. Applied Surface Science, 100. 30-35 doi:10.1016/0169-4332(96)00251-6
Kita, A., Ozawa, M., Gutleben, C.D. (1996) XPS analysis of chemically etched II–VI semiconductor surfaces. Applied Surface Science, 100. 652-655 doi:10.1016/0169-4332(96)00357-1
Kudo, M., Ishijima, A., Morohashi, T. (1996) Ion induced alteration at Pb-Sn alloy surface investigated by Auger electron spectroscopy and X-ray photoelectron spectroscopy. Applied Surface Science, 100. 134-137 doi:10.1016/0169-4332(96)00273-5
Kitada, T., Harada, T., Tanuma, S. (1996) Analysis of Auger sputter depth profiles with a resolution function. Applied Surface Science, 100. 89-91 doi:10.1016/0169-4332(96)00359-5
Ding, Z.-J., Shimizu, R., Goto, K. (1996) Intrinsic Auger signal profiles derived by Monte Carlo analysis. Applied Surface Science, 100. 15-19 doi:10.1016/0169-4332(96)00248-6
Ohdaira, Toshiyuki, Suzuki, Ryoichi, Mikado, Tomohisa, Ohgaki, Hideaki, Chiwaki, Mitsukuni, Yamazaki, Tetsuo, Hasegawa, Masataka (1996) High sensitivity of positron-annihilation induced Auger-electron spectroscopy to surface impurities. Applied Surface Science, 100. 73-76 doi:10.1016/0169-4332(96)00260-7
Ito, Hisaji, Ito, Mototaka, Magatani, Y., Soeda, F. (1996) Submicron particle analysis by the Auger microprobe (FE-SAM). Applied Surface Science, 100. 152-155 doi:10.1016/0169-4332(96)00360-1
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 18, 2025 18:31:03
Go to top of page