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Suzuki, M., Mogi, K., Takenaka, H. (1996) Auger electron spectroscopy measurement of electron attenuation lengths using multilayer systems. Applied Surface Science, 100. 51-55 doi:10.1016/0169-4332(96)00255-3

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Reference TypeJournal (article/letter/editorial)
TitleAuger electron spectroscopy measurement of electron attenuation lengths using multilayer systems
JournalApplied Surface Science
AuthorsSuzuki, M.Author
Mogi, K.Author
Takenaka, H.Author
Year1996 (July)Volume100
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(96)00255-3Search in ResearchGate
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Mindat Ref. ID9898439Long-form Identifiermindat:1:5:9898439:6
GUID0
Full ReferenceSuzuki, M., Mogi, K., Takenaka, H. (1996) Auger electron spectroscopy measurement of electron attenuation lengths using multilayer systems. Applied Surface Science, 100. 51-55 doi:10.1016/0169-4332(96)00255-3
Plain TextSuzuki, M., Mogi, K., Takenaka, H. (1996) Auger electron spectroscopy measurement of electron attenuation lengths using multilayer systems. Applied Surface Science, 100. 51-55 doi:10.1016/0169-4332(96)00255-3
In(n.d.) Applied Surface Science Vol. 100. Elsevier BV

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