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Watamori, Michio, Maeda, Yasuhiro, Kubo, Osamu, Oura, Kenjiro (1997) A new method for the detection of native oxide on Si with combined use of 16O(α,α)16O resonance and channeling. Applied Surface Science, 113. 403-407 doi:10.1016/s0169-4332(96)00832-x

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Reference TypeJournal (article/letter/editorial)
TitleA new method for the detection of native oxide on Si with combined use of 16O(α,α)16O resonance and channeling
JournalApplied Surface Science
AuthorsWatamori, MichioAuthor
Maeda, YasuhiroAuthor
Kubo, OsamuAuthor
Oura, KenjiroAuthor
Year1997 (April)Volume113
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(96)00832-xSearch in ResearchGate
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Mindat Ref. ID9899306Long-form Identifiermindat:1:5:9899306:6
GUID0
Full ReferenceWatamori, Michio, Maeda, Yasuhiro, Kubo, Osamu, Oura, Kenjiro (1997) A new method for the detection of native oxide on Si with combined use of 16O(α,α)16O resonance and channeling. Applied Surface Science, 113. 403-407 doi:10.1016/s0169-4332(96)00832-x
Plain TextWatamori, Michio, Maeda, Yasuhiro, Kubo, Osamu, Oura, Kenjiro (1997) A new method for the detection of native oxide on Si with combined use of 16O(α,α)16O resonance and channeling. Applied Surface Science, 113. 403-407 doi:10.1016/s0169-4332(96)00832-x
In(n.d.) Applied Surface Science Vol. 113. Elsevier BV

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Ohba, Yasuyuki, Katayama, Itsuo, Yamamoto, Yasuji, Watamori, Michio, Oura, Kenjiro (1997) Reconstruction and growth of Ag on hydrogen-terminated Si(111) surfaces. Applied Surface Science, 113. 448-452 doi:10.1016/s0169-4332(96)00900-2
Watamori, Michio, Oura, Kenjiro, Hirao, Takashi, Sasabe, Kaoru (1996) Channeling analysis of oxygen in oxide materials using 16O(α, α)16O resonant backscattering. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 118 (1). 233-237 doi:10.1016/0168-583x(95)01076-9
Watamori, Michio, Oura, Kenjiro, Hirao, Takashi, Sasabe, Kaoru (1996) Backscattering analysis of thin SiO2 films on Si using 16O(α,α)16O 3.045 MeV resonance. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 118 (1). 228-232 doi:10.1016/0168-583x(95)01168-4
Honda, Shin-ichi, Chihara, Koji, Watamori, Michio, Oura, Kenjiro (1997) Depth profiling of oxygen content of indium tin oxide fabricated by bias sputtering. Applied Surface Science, 113. 408-411 doi:10.1016/s0169-4332(96)00939-7
Watamori, Michio, Honda, Shin-ichi, Kubo, Osamu, Kanno, Isaku, Hirao, Takashi, Sasabe, Kaoru, Oura, Kenjiro (1997) High-energy ion beam analysis of ferroelectric thin films. Applied Surface Science, 117. 453-458 doi:10.1016/s0169-4332(97)80124-9
Watamori, Michio, Naitoh, Masamichi, Morioka, Hajime, Maeda, Yasuhiro, Oura, Kenjiro (1994) Low temperature adsorption of hydrogen on Si(111) and (100) surfaces studied by elastic recoil detection analysis. Applied Surface Science, 82. 417-421 doi:10.1016/0169-4332(94)90251-8
Ohba, Yasuyuki, Katayama, Itsuo, Numata, Toshinori, Ohnishi, Hideaki, Watamori, Michio, Oura, Kenjiro (1997) STM observation of Ag clustering on hydrogen-terminated Si(100) surfaces. Applied Surface Science, 121. 191-194 doi:10.1016/s0169-4332(97)00286-9
Watamori, Michio, Isono, Motoshi, Madono, Hiroyuki, Kawano, Yuichi, Sasabe, Kaoru, Hirao, Takashi, Oura, Kenjiro (1999) Ion beam analysis of PZT thin films. Applied Surface Science, 142. 422-427 doi:10.1016/s0169-4332(98)00681-3
Watamori, Michio, Shoji, Fumiya, Oura, Kenjiro (1994) Methodology for Accurate Oxygen Distribution Analysis and Its Application toYBa2Cu3OxThin Films Using16O(α, α)16O3.045 MeV Resonance Reaction. Japanese Journal of Applied Physics, 33. 6039-6045 doi:10.1143/jjap.33.6039
Saranin, A.A., Numata, T., Kubo, O., Katayama, M., Katayama, I., Oura, K. (1997) STM observation of the atomic hydrogen adsorption on the Si(111)4 × 1-In surface. Applied Surface Science, 113. 354-359 doi:10.1016/s0169-4332(96)00901-4
Ryu, Jeong-Tak, Kui, Kouichiro, Tanaka, Yasunori, Katayama, Mitsuhiro, Oura, Kenjiro, Katayama, Itsuo (1997) TOF-ICISS observation of Pb growth on the surface. Applied Surface Science, 113. 393-397 doi:10.1016/s0169-4332(96)00819-7
 
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