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Watamori, Michio, Isono, Motoshi, Madono, Hiroyuki, Kawano, Yuichi, Sasabe, Kaoru, Hirao, Takashi, Oura, Kenjiro (1999) Ion beam analysis of PZT thin films. Applied Surface Science, 142. 422-427 doi:10.1016/s0169-4332(98)00681-3

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Reference TypeJournal (article/letter/editorial)
TitleIon beam analysis of PZT thin films
JournalApplied Surface Science
AuthorsWatamori, MichioAuthor
Isono, MotoshiAuthor
Madono, HiroyukiAuthor
Kawano, YuichiAuthor
Sasabe, KaoruAuthor
Hirao, TakashiAuthor
Oura, KenjiroAuthor
Year1999 (April)Volume142
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00681-3Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9900997Long-form Identifiermindat:1:5:9900997:5
GUID0
Full ReferenceWatamori, Michio, Isono, Motoshi, Madono, Hiroyuki, Kawano, Yuichi, Sasabe, Kaoru, Hirao, Takashi, Oura, Kenjiro (1999) Ion beam analysis of PZT thin films. Applied Surface Science, 142. 422-427 doi:10.1016/s0169-4332(98)00681-3
Plain TextWatamori, Michio, Isono, Motoshi, Madono, Hiroyuki, Kawano, Yuichi, Sasabe, Kaoru, Hirao, Takashi, Oura, Kenjiro (1999) Ion beam analysis of PZT thin films. Applied Surface Science, 142. 422-427 doi:10.1016/s0169-4332(98)00681-3
In(n.d.) Applied Surface Science Vol. 142. Elsevier BV

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Watamori, Michio, Honda, Shin-ichi, Kubo, Osamu, Kanno, Isaku, Hirao, Takashi, Sasabe, Kaoru, Oura, Kenjiro (1997) High-energy ion beam analysis of ferroelectric thin films. Applied Surface Science, 117. 453-458 doi:10.1016/s0169-4332(97)80124-9
Watamori, Michio, Oura, Kenjiro, Hirao, Takashi, Sasabe, Kaoru (1996) Backscattering analysis of thin SiO2 films on Si using 16O(α,α)16O 3.045 MeV resonance. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 118 (1). 228-232 doi:10.1016/0168-583x(95)01168-4
Watamori, Michio, Oura, Kenjiro, Hirao, Takashi, Sasabe, Kaoru (1996) Channeling analysis of oxygen in oxide materials using 16O(α, α)16O resonant backscattering. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 118 (1). 233-237 doi:10.1016/0168-583x(95)01076-9
Ohba, Yasuyuki, Katayama, Itsuo, Yamamoto, Yasuji, Watamori, Michio, Oura, Kenjiro (1997) Reconstruction and growth of Ag on hydrogen-terminated Si(111) surfaces. Applied Surface Science, 113. 448-452 doi:10.1016/s0169-4332(96)00900-2
Honda, Shin-ichi, Chihara, Koji, Watamori, Michio, Oura, Kenjiro (1997) Depth profiling of oxygen content of indium tin oxide fabricated by bias sputtering. Applied Surface Science, 113. 408-411 doi:10.1016/s0169-4332(96)00939-7
Ohba, Yasuyuki, Katayama, Itsuo, Numata, Toshinori, Ohnishi, Hideaki, Watamori, Michio, Oura, Kenjiro (1997) STM observation of Ag clustering on hydrogen-terminated Si(100) surfaces. Applied Surface Science, 121. 191-194 doi:10.1016/s0169-4332(97)00286-9
Tanaka, Yasunori, Morishita, Hideki, Watamori, Michio, Oura, Kenjiro, Katayama, Itsuo (1994) Structural study of SrTiO3(100) surfaces by low energy ion scattering. Applied Surface Science, 82. 528-531 doi:10.1016/0169-4332(94)90269-0
Watamori, Michio, Oura, Kenjiro, Shoji, Fumiya, Yotsuya, Tsutomu, Ogawa, Soichi, Hanawa, Teruo (1989) High-Energy Ion Beam Analysis of YBa2Cu3OxThin Films. Japanese Journal of Applied Physics, 28. 346-350 doi:10.1143/jjap.28.346
Baek, Yang-Gyu, Ikuno, Takashi, Ryu, Jeong-Tak, Honda, Shin-ichi, Katayama, Mitsuhiro, Oura, Kenjiro, Hirao, Takashi (2002) Field electron emission from amorphous carbon films grown in pure methane plasma. Applied Surface Science, 185. 243-247 doi:10.1016/s0169-4332(01)00786-3
Watamori, Michio, Maeda, Yasuhiro, Kubo, Osamu, Oura, Kenjiro (1997) A new method for the detection of native oxide on Si with combined use of 16O(α,α)16O resonance and channeling. Applied Surface Science, 113. 403-407 doi:10.1016/s0169-4332(96)00832-x
Lappalainen, Jyrki, Frantti, Johannes, Lantto, Vilho (1999) Effect of laser-ablation process parameters and post-annealing treatment on ferroelectric PZT thin films. Applied Surface Science, 142. 407-412 doi:10.1016/s0169-4332(98)00711-9
 
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