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Bukaluk, Antoni (1999) Comparative AES studies of grain boundary diffusion in thin polycrystalline Ag/Pd, Au/Pd and Cu/Pd films. Applied Surface Science, 144. 395-398 doi:10.1016/s0169-4332(98)00750-8

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Reference TypeJournal (article/letter/editorial)
TitleComparative AES studies of grain boundary diffusion in thin polycrystalline Ag/Pd, Au/Pd and Cu/Pd films
JournalApplied Surface Science
AuthorsBukaluk, AntoniAuthor
Year1999 (April)Volume144
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00750-8Search in ResearchGate
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Mindat Ref. ID9901122Long-form Identifiermindat:1:5:9901122:6
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Full ReferenceBukaluk, Antoni (1999) Comparative AES studies of grain boundary diffusion in thin polycrystalline Ag/Pd, Au/Pd and Cu/Pd films. Applied Surface Science, 144. 395-398 doi:10.1016/s0169-4332(98)00750-8
Plain TextBukaluk, Antoni (1999) Comparative AES studies of grain boundary diffusion in thin polycrystalline Ag/Pd, Au/Pd and Cu/Pd films. Applied Surface Science, 144. 395-398 doi:10.1016/s0169-4332(98)00750-8
In(n.d.) Applied Surface Science Vol. 144. Elsevier BV

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Vasilyev, A.D., Bekrenev, A.N. (2002) Influence of lattice misfit on diffusion coefficients in thin films polycrystalline Pd–Ag and Pd–Au systems. Applied Surface Science, 191. 1-4 doi:10.1016/s0169-4332(01)00352-x
Vasilyev, A.D., Bekrenev, A.N. (2000) Influence of free surface and interfaces on diffusion coefficients in Pd–Ag and Pd–Au polycrystalline thin films systems. Applied Surface Science, 161. 14-19 doi:10.1016/s0169-4332(00)00029-5
Bukaluk, A (2001) Auger electron spectroscopy investigations of the effect of degradation of depth resolution and its influence on the interdiffusion data in thin film Au/Ag, Cu/Ag, Pd/Au and Pd/Cu multilayer structures. Applied Surface Science, 175. 790-796 doi:10.1016/s0169-4332(01)00070-8
Bukaluk, Antoni, Bała, Wacław (1990) AES depth profile studies of interdiffusion in thin polycrystalline Au-Ag multilayer films. Applied Surface Science, 45. 57-64 doi:10.1016/0169-4332(90)90020-z
Bukaluk, Antoni (1989) Comparative AES studies of Cu diffusion through thin evaporated and ion-plated Ag-Sn films. Surface Science Letters, 213 (2). doi:10.1016/0167-2584(89)90471-4
Bukaluk, Antoni (1989) Comparative aes studies of Cu diffusion through thin evaporated and ion-plated AgSn films. Surface Science, 213 (2). 464-480 doi:10.1016/0039-6028(89)90306-3
Bukaluk, Antoni (1989) Determination of the activation energy of Ag diffusion through grain boundaries of thin Au films by using AES in a simplified accumulation method. Applied Surface Science, 35. 317-326 doi:10.1016/0169-4332(89)90015-9
Wronkowska, A.A., Wronkowski, A., Bukaluk, A., Trzciński, M., Okulewicz, K. (2007) Characterization of In/Pd and Pd/In/Pd thin films by ellipsometric, XRD and AES methods. Applied Surface Science, 253. 3367-3371 doi:10.1016/j.apsusc.2006.12.016
Wronkowska, A.A., Wronkowski, A., Bukaluk, A., Trzcinski, M., Okulewicz, K., Skowroński, Ł. (2008) Structural analysis of In/Ag, In/Cu and In/Pd thin films on tungsten by ellipsometric, XRD and AES methods. Applied Surface Science, 254. 4401-4407 doi:10.1016/j.apsusc.2008.01.006
Bukaluk, Antoni (1983) Analysis of diffusion mechanisms in thin polycrystalline Au-Ag films using auger electron spectroscopy. Surface and Interface Analysis, 5 (1). 20-27 doi:10.1002/sia.740050106
Guo, Q, Joyner, R.W (1999) An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110). Applied Surface Science, 144. 375-379 doi:10.1016/s0169-4332(98)00827-7
 
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