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Guo, Q, Joyner, R.W (1999) An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110). Applied Surface Science, 144. 375-379 doi:10.1016/s0169-4332(98)00827-7

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Reference TypeJournal (article/letter/editorial)
TitleAn X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110)
JournalApplied Surface Science
AuthorsGuo, QAuthor
Joyner, R.WAuthor
Year1999 (April)Volume144
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00827-7Search in ResearchGate
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Mindat Ref. ID9901189Long-form Identifiermindat:1:5:9901189:1
GUID0
Full ReferenceGuo, Q, Joyner, R.W (1999) An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110). Applied Surface Science, 144. 375-379 doi:10.1016/s0169-4332(98)00827-7
Plain TextGuo, Q, Joyner, R.W (1999) An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110). Applied Surface Science, 144. 375-379 doi:10.1016/s0169-4332(98)00827-7
In(n.d.) Applied Surface Science Vol. 144. Elsevier BV

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