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Seah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0

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Reference TypeJournal (article/letter/editorial)
TitleReference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined
JournalApplied Surface Science
AuthorsSeah, M.PAuthor
Year1999 (April)Volume144
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00788-0Search in ResearchGate
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Mindat Ref. ID9901151Long-form Identifiermindat:1:5:9901151:8
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Full ReferenceSeah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0
Plain TextSeah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0
In(n.d.) Applied Surface Science Vol. 144. Elsevier BV

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Seah, M.P, Gilmore, I.S, Spencer, S.J (1999) Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy. Applied Surface Science, 144. 132-136 doi:10.1016/s0169-4332(98)00913-1
Seah, M.P, Gilmore, I.S, Spencer, S.J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Applied Surface Science, 144. 178-182 doi:10.1016/s0169-4332(98)00789-2
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Lesiak, Beata, Zemek, Jozef, Jozwik, Adam (1998) Phase distinction in semi-insulating polycrystalline silicon by pattern recognition of X-ray photoelectron spectroscopy/X-ray-induced Auger electron spectroscopy data. Applied Surface Science, 135. 318-330 doi:10.1016/s0169-4332(98)00289-x
Komolov, Alexei, Schaumburg, Kjeld, Møller, Preben J, Monakhov, Vadim (1999) Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage. Applied Surface Science, 142. 591-597 doi:10.1016/s0169-4332(98)00924-6
Seah, M.P, Brown, M.T (1999) Validation and accuracy of peak synthesis software for XPS. Applied Surface Science, 144. 183-187 doi:10.1016/s0169-4332(98)00787-9
Guo, Q, Joyner, R.W (1999) An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110). Applied Surface Science, 144. 375-379 doi:10.1016/s0169-4332(98)00827-7
Schöberl, Thomas (1999) Applying Auger electron spectroscopy to the Li depletion in heat treated Al–Li sheets. Applied Surface Science, 144. 350-354 doi:10.1016/s0169-4332(98)00825-3
Viviente, J.L, Garcı́a, A, Alonso, F, Braceras, I, Oñate, J.I (1999) X-ray photoelectron spectroscopy characterization of high dose carbon-implanted steel and titanium alloys. Applied Surface Science, 144. 249-254 doi:10.1016/s0169-4332(98)00806-x
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