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Seah, M.P, Brown, M.T (1999) Validation and accuracy of peak synthesis software for XPS. Applied Surface Science, 144. 183-187 doi:10.1016/s0169-4332(98)00787-9

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Reference TypeJournal (article/letter/editorial)
TitleValidation and accuracy of peak synthesis software for XPS
JournalApplied Surface Science
AuthorsSeah, M.PAuthor
Brown, M.TAuthor
Year1999 (April)Volume144
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00787-9Search in ResearchGate
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Mindat Ref. ID9901150Long-form Identifiermindat:1:5:9901150:9
GUID0
Full ReferenceSeah, M.P, Brown, M.T (1999) Validation and accuracy of peak synthesis software for XPS. Applied Surface Science, 144. 183-187 doi:10.1016/s0169-4332(98)00787-9
Plain TextSeah, M.P, Brown, M.T (1999) Validation and accuracy of peak synthesis software for XPS. Applied Surface Science, 144. 183-187 doi:10.1016/s0169-4332(98)00787-9
In(n.d.) Applied Surface Science Vol. 144. Elsevier BV

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Gilmore, I.S, Seah, M.P (1999) Static SIMS: metastable decay and peak intensities. Applied Surface Science, 144. 26-30 doi:10.1016/s0169-4332(98)00757-0
Seah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0
Gilmore, I.S, Seah, M.P (1999) Static SIMS: ion detection efficiencies in a channel electron multiplier. Applied Surface Science, 144. 113-117 doi:10.1016/s0169-4332(98)00779-x
Gilmore, I.S., Seah, M.P. (2002) Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS. Applied Surface Science, 187. 89-100 doi:10.1016/s0169-4332(01)00787-5
Seah, M.P, Gilmore, I.S, Spencer, S.J (1999) Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy. Applied Surface Science, 144. 132-136 doi:10.1016/s0169-4332(98)00913-1
Seah, M.P, Gilmore, I.S, Spencer, S.J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Applied Surface Science, 144. 178-182 doi:10.1016/s0169-4332(98)00789-2
Seah, M.P, Spencer, S.J, Cumpson, P.J, Johnstone, J.E (1999) Cones formed during sputtering of InP and their use in defining AFM tip shapes. Applied Surface Science, 144. 151-155 doi:10.1016/s0169-4332(98)00794-6
Seah, M.P. (1993) AES and XPS measurements: reducing the uncertainty and improving the accuracy. Applied Surface Science, 70. 1-8 doi:10.1016/0169-4332(93)90388-r
Cumpson, Peter J (1999) Angle-resolved XPS depth-profiling strategies. Applied Surface Science, 144. 16-20 doi:10.1016/s0169-4332(98)00752-1
Johansson, Leena-Sisko, Campbell, J.M, Koljonen, Krista, Stenius, Per (1999) Evaluation of surface lignin on cellulose fibers with XPS. Applied Surface Science, 144. 92-95 doi:10.1016/s0169-4332(98)00920-9
Bersani, M, Vanzetti, L, Sbetti, M, Anderle, M (1999) Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses. Applied Surface Science, 144. 301-305 doi:10.1016/s0169-4332(98)00814-9
 
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