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Seah, M.P, Gilmore, I.S, Spencer, S.J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Applied Surface Science, 144. 178-182 doi:10.1016/s0169-4332(98)00789-2

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers
JournalApplied Surface Science
AuthorsSeah, M.PAuthor
Gilmore, I.SAuthor
Spencer, S.JAuthor
Year1999 (April)Volume144
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00789-2Search in ResearchGate
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Mindat Ref. ID9901152Long-form Identifiermindat:1:5:9901152:7
GUID0
Full ReferenceSeah, M.P, Gilmore, I.S, Spencer, S.J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Applied Surface Science, 144. 178-182 doi:10.1016/s0169-4332(98)00789-2
Plain TextSeah, M.P, Gilmore, I.S, Spencer, S.J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Applied Surface Science, 144. 178-182 doi:10.1016/s0169-4332(98)00789-2
In(n.d.) Applied Surface Science Vol. 144. Elsevier BV

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Seah, M.P, Gilmore, I.S, Spencer, S.J (1999) Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy. Applied Surface Science, 144. 132-136 doi:10.1016/s0169-4332(98)00913-1
Seah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0
Gilmore, I.S, Seah, M.P (1999) Static SIMS: metastable decay and peak intensities. Applied Surface Science, 144. 26-30 doi:10.1016/s0169-4332(98)00757-0
Gilmore, I.S, Seah, M.P (1999) Static SIMS: ion detection efficiencies in a channel electron multiplier. Applied Surface Science, 144. 113-117 doi:10.1016/s0169-4332(98)00779-x
Gilmore, I.S, Seah, M.P (2003) G-SIMS of crystallisable organics. Applied Surface Science, 203. 551-555 doi:10.1016/s0169-4332(02)00757-2
Seah, M.P, Spencer, S.J, Cumpson, P.J, Johnstone, J.E (1999) Cones formed during sputtering of InP and their use in defining AFM tip shapes. Applied Surface Science, 144. 151-155 doi:10.1016/s0169-4332(98)00794-6
Seah, M.P, Brown, M.T (1999) Validation and accuracy of peak synthesis software for XPS. Applied Surface Science, 144. 183-187 doi:10.1016/s0169-4332(98)00787-9
Gilmore, I.S, Seah, M.P (2003) Investigating the difficulty of eliminating flood gun damage in TOF-SIMS. Applied Surface Science, 203. 600-604 doi:10.1016/s0169-4332(02)00774-2
Gilmore, I.S, Seah, M.P (2000) Static SIMS: towards unfragmented mass spectra β€” the G-SIMS procedure. Applied Surface Science, 161. 465-480 doi:10.1016/s0169-4332(00)00317-2
Seah, M.P., Gilmore, I.S., Spencer, S.J. (2000) Background subtraction. Surface Science, 461 (1). 1-15 doi:10.1016/s0039-6028(00)00373-3
Seah, M. P. (2001) Summary of ISO/TC 201 Standard: VII ISO 15472 : 2001?surface chemical analysis?x-ray photoelectron spectrometers?calibration of energy scales. Surface and Interface Analysis, 31 (8). 721-723 doi:10.1002/sia.1076
 
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