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Komolov, Alexei, Schaumburg, Kjeld, Møller, Preben J, Monakhov, Vadim (1999) Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage. Applied Surface Science, 142. 591-597 doi:10.1016/s0169-4332(98)00924-6

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage
JournalApplied Surface Science
AuthorsKomolov, AlexeiAuthor
Schaumburg, KjeldAuthor
Møller, Preben JAuthor
Monakhov, VadimAuthor
Year1999 (April)Volume142
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00924-6Search in ResearchGate
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Mindat Ref. ID9901063Long-form Identifiermindat:1:5:9901063:4
GUID0
Full ReferenceKomolov, Alexei, Schaumburg, Kjeld, Møller, Preben J, Monakhov, Vadim (1999) Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage. Applied Surface Science, 142. 591-597 doi:10.1016/s0169-4332(98)00924-6
Plain TextKomolov, Alexei, Schaumburg, Kjeld, Møller, Preben J, Monakhov, Vadim (1999) Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage. Applied Surface Science, 142. 591-597 doi:10.1016/s0169-4332(98)00924-6
In(n.d.) Applied Surface Science Vol. 142. Elsevier BV

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Seah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0
Komolov, Alexei, Schaumburg, Kjeld, Monakhov, Vadim (1999) Photovoltage and photoconductivity in Si/organic film/metal structures with films made of poly(3-alkylthiophene) molecules and polycyclic conjugated molecules. Synthetic Metals, 105 (1). 29-33 doi:10.1016/s0379-6779(99)00068-5
POWELL, C, JABLONSKI, A, WERNER, W, SMEKAL, W (2005) Corrigendum to “Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy”[Applied Surface Science 239 (2005) 470–480]. Applied Surface Science, 242. 219pp. doi:10.1016/s0169-4332(05)00046-2
Lesiak, Beata, Zemek, Jozef, Jozwik, Adam (1998) Phase distinction in semi-insulating polycrystalline silicon by pattern recognition of X-ray photoelectron spectroscopy/X-ray-induced Auger electron spectroscopy data. Applied Surface Science, 135. 318-330 doi:10.1016/s0169-4332(98)00289-x
Dufrêne, Yves F, Marchal, Thibault G, Rouxhet, Paul G (1999) Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling. Applied Surface Science, 144. 638-643 doi:10.1016/s0169-4332(98)00881-2
Komolov, Alexei, Møller, Preben J. (2005) Unoccupied electronic band structure of conjugated molecular films interfacing polycrystalline gold surface. Applied Surface Science, 244. 573-577 doi:10.1016/j.apsusc.2004.10.122
Møller, P.J, Komolov, S.A, Lazneva, E.F, Egebjerg, T (1999) Oxygen effect on the conductivity of the CuxO/ZnO(0001) and (0001̄) systems. Applied Surface Science, 142. 210-214 doi:10.1016/s0169-4332(98)00693-x
Guo, Q, Joyner, R.W (1999) An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110). Applied Surface Science, 144. 375-379 doi:10.1016/s0169-4332(98)00827-7
Alstrup, Ib, Møller, Preben J. (1988) X-ray photoelectron spectroscopy study of the vapor deposition of copper onto a MgO(100) surface. Applied Surface Science, 33. 143-151 doi:10.1016/0169-4332(88)90299-1
Yang, De-Quan, Sun, Yan, Da, Dao-An (1999) Structural studies of functional organized molecular thin films using angle-resolved X-ray photoelectron spectroscopy. Applied Surface Science, 144. 451-455 doi:10.1016/s0169-4332(98)00751-x
Atanassova, E, Spassov, D (1998) X-ray photoelectron spectroscopy of thermal thin Ta2O5 films on Si. Applied Surface Science, 135. 71-82 doi:10.1016/s0169-4332(98)00278-5
 
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