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Dufrêne, Yves F, Marchal, Thibault G, Rouxhet, Paul G (1999) Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling. Applied Surface Science, 144. 638-643 doi:10.1016/s0169-4332(98)00881-2

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Reference TypeJournal (article/letter/editorial)
TitleProbing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling
JournalApplied Surface Science
AuthorsDufrêne, Yves FAuthor
Marchal, Thibault GAuthor
Rouxhet, Paul GAuthor
Year1999 (April)Volume144
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00881-2Search in ResearchGate
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Mindat Ref. ID9901238Long-form Identifiermindat:1:5:9901238:6
GUID0
Full ReferenceDufrêne, Yves F, Marchal, Thibault G, Rouxhet, Paul G (1999) Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling. Applied Surface Science, 144. 638-643 doi:10.1016/s0169-4332(98)00881-2
Plain TextDufrêne, Yves F, Marchal, Thibault G, Rouxhet, Paul G (1999) Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling. Applied Surface Science, 144. 638-643 doi:10.1016/s0169-4332(98)00881-2
In(n.d.) Applied Surface Science Vol. 144. Elsevier BV

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Dufrêne, Yves F., Marchal, Thibault G., Rouxhet, Paul G. (1999) Influence of Substratum Surface Properties on the Organization of Adsorbed Collagen Films:  In Situ Characterization by Atomic Force Microscopy. Langmuir, 15. 2871-2878 doi:10.1021/la981066z
Komolov, Alexei, Schaumburg, Kjeld, Møller, Preben J, Monakhov, Vadim (1999) Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage. Applied Surface Science, 142. 591-597 doi:10.1016/s0169-4332(98)00924-6
Seah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0
Dague, Etienne, Delcorte, Arnaud, Latgé, Jean-Paul, Dufrêne, Yves F. (2008) Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis. Langmuir, 24. 2955-2959 doi:10.1021/la703741y
van der Aa, Bruno C., Michel, Romain M., Asther, Marcel, Torrez Zamora, Marco, Rouxhet, Paul G., Dufrêne, Yves F. (2001) Stretching Cell Surface Macromolecules by Atomic Force Microscopy. Langmuir, 17. 3116-3119 doi:10.1021/la001573s
Dufrêne, Yves F, Boonaert, Christophe J.P, van der Mei, Henny C, Busscher, Henk J, Rouxhet, Paul G (2001) Probing molecular interactions and mechanical properties of microbial cell surfaces by atomic force microscopy. Ultramicroscopy, 86 (1). 113-120 doi:10.1016/s0304-3991(00)00079-6
Guo, Q, Joyner, R.W (1999) An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110). Applied Surface Science, 144. 375-379 doi:10.1016/s0169-4332(98)00827-7
Viviente, J.L, Garcı́a, A, Alonso, F, Braceras, I, Oñate, J.I (1999) X-ray photoelectron spectroscopy characterization of high dose carbon-implanted steel and titanium alloys. Applied Surface Science, 144. 249-254 doi:10.1016/s0169-4332(98)00806-x
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Czerwosz, E, Dluzewski, P, Dmowska, G, Nowakowski, R, Starnawska, E, Wronka, H (1999) Atomic force microscopy and transmission electron microscopy investigations of catalytic formed nanotubes in C60/C70+Ni layers. Applied Surface Science, 141. 350-356 doi:10.1016/s0169-4332(98)00523-6
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