McCafferty, E, Wightman, J.P (1999) An X-ray photoelectron spectroscopy sputter profile study of the native air-formed oxide film on titanium. Applied Surface Science, 143. 92-100 doi:10.1016/s0169-4332(98)00927-1
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | An X-ray photoelectron spectroscopy sputter profile study of the native air-formed oxide film on titanium | ||
Journal | Applied Surface Science | ||
Authors | McCafferty, E | Author | |
Wightman, J.P | Author | ||
Year | 1999 (April) | Volume | 143 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(98)00927-1Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9901095 | Long-form Identifier | mindat:1:5:9901095:3 |
GUID | 0 | ||
Full Reference | McCafferty, E, Wightman, J.P (1999) An X-ray photoelectron spectroscopy sputter profile study of the native air-formed oxide film on titanium. Applied Surface Science, 143. 92-100 doi:10.1016/s0169-4332(98)00927-1 | ||
Plain Text | McCafferty, E, Wightman, J.P (1999) An X-ray photoelectron spectroscopy sputter profile study of the native air-formed oxide film on titanium. Applied Surface Science, 143. 92-100 doi:10.1016/s0169-4332(98)00927-1 | ||
In | (n.d.) Applied Surface Science Vol. 143. Elsevier BV |
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