Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of low dielectric constant amorphous carbon nitride films |
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Journal | Applied Surface Science |
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Authors | Aono, M | Author |
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Nitta, S | Author |
Katsuno, T | Author |
Itoh, T | Author |
Nonomura, S | Author |
Year | 2000 (June) | Volume | 159 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(00)00057-xSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9901897 | Long-form Identifier | mindat:1:5:9901897:3 |
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GUID | 0 |
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Full Reference | Aono, M, Nitta, S, Katsuno, T, Itoh, T, Nonomura, S (2000) Characterization of low dielectric constant amorphous carbon nitride films. Applied Surface Science, 159. 341-344 doi:10.1016/s0169-4332(00)00057-x |
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Plain Text | Aono, M, Nitta, S, Katsuno, T, Itoh, T, Nonomura, S (2000) Characterization of low dielectric constant amorphous carbon nitride films. Applied Surface Science, 159. 341-344 doi:10.1016/s0169-4332(00)00057-x |
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In | (n.d.) Applied Surface Science Vol. 159. Elsevier BV |
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