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Mihara, I, An, Z.L, Kinoshita, A, Hirai, M, Kusaka, M, Iwami, M (2000) Characterization of the buried interface in a Ni (film)/3C-SiC (substrate) system using SXES. Applied Surface Science, 159. 197-200 doi:10.1016/s0169-4332(00)00063-5

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of the buried interface in a Ni (film)/3C-SiC (substrate) system using SXES
JournalApplied Surface Science
AuthorsMihara, IAuthor
An, Z.LAuthor
Kinoshita, AAuthor
Hirai, MAuthor
Kusaka, MAuthor
Iwami, MAuthor
Year2000 (June)Volume159
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(00)00063-5Search in ResearchGate
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Mindat Ref. ID9901903Long-form Identifiermindat:1:5:9901903:3
GUID0
Full ReferenceMihara, I, An, Z.L, Kinoshita, A, Hirai, M, Kusaka, M, Iwami, M (2000) Characterization of the buried interface in a Ni (film)/3C-SiC (substrate) system using SXES. Applied Surface Science, 159. 197-200 doi:10.1016/s0169-4332(00)00063-5
Plain TextMihara, I, An, Z.L, Kinoshita, A, Hirai, M, Kusaka, M, Iwami, M (2000) Characterization of the buried interface in a Ni (film)/3C-SiC (substrate) system using SXES. Applied Surface Science, 159. 197-200 doi:10.1016/s0169-4332(00)00063-5
In(n.d.) Applied Surface Science Vol. 159. Elsevier BV

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An, Z., Hirai, M., Kusaka, M., Iwami, M. (2003) Surface and interface study of Cu (film)/SiC (substrate) system. Applied Surface Science, 216. 169-173 doi:10.1016/s0169-4332(03)00459-8
Hattori, N., Hirai, M., Kusaka, M., Iwami, M. (2003) Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy. Applied Surface Science, 216. 54-58 doi:10.1016/s0169-4332(03)00498-7
Ohi, A., Labis, J., Morikawa, Y., Fujiki, T., Hirai, M., Kusaka, M., Iwami, M. (2002) Soft X-ray emission study of thermally treated Ni(film)/4H–SiC(substrate) interface. Applied Surface Science, 190. 366-370 doi:10.1016/s0169-4332(01)00860-1
Yamauchi, S., Hirai, M., Kusaka, M., Iwami, M., Nakamura, H., Yokota, Y., Akiyama, A., Watabe, H. (1992) TEM and SXES study of Ni-silicide/Si interface: crystallographic relationship with the Si substrates. Applied Surface Science, 60. 372-379 doi:10.1016/0169-4332(92)90446-5
Jikimoto, T., Tsukamoto, T., Kinoshita, A., Satoh, Y., Hirai, M., Kusaka, M., Iwami, M., Nakata, T. (1997) Photoemission study of 6H-SiC(0001)Si face. Applied Surface Science, 117. 794-797 doi:10.1016/s0169-4332(97)80185-7
Iwami, M., Kusaka, M., Hirai, M., Tagami, R., Nakamura, H., Watabe, H. (1997) Soft X-ray emission spectroscopy study of CaF2(film)/Si(111): non-destructive buried interface analysis. Applied Surface Science, 117. 434-437 doi:10.1016/s0169-4332(97)80120-1
Labis, Joselito, Ohi, Akihiko, Kamezawa, Chihiro, Yoshida, Kenichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro (2002) Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study. Applied Surface Science, 190. 521-526 doi:10.1016/s0169-4332(01)00931-x
An, Z, Ohi, A, Hirai, M, Kusaka, M, Iwami, M (2001) Study of the reaction at Cu/3C–SiC interface. Surface Science, 493 (1). 182-187 doi:10.1016/s0039-6028(01)01211-0
Hirai, M., Marumoto, Y., Kusaka, M., Iwami, M., Ozawa, T., Nagamura, T., Nakata, T. (1997) Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy. Applied Surface Science, 113. 360-363 doi:10.1016/s0169-4332(96)00904-x
Morikawa, Y., Hirai, M., Ohi, A., Kusaka, M., Iwami, M. (2007) Heteroepitaxial growth of 3C–SiC film on Si(100) substrate by plasma chemical vapor deposition using monomethylsilane. Journal of Materials Research, 22 (5) 1275-1280 doi:10.1557/jmr.2007.0151
An, Z, Hirai, M, Kusaka, M, Iwami, M (2003) Comparative PEEM and AES study of surface morphology and composition of Cu films on Si and 3C–SiC substrates. Surface Science, 547 (1). 193-200 doi:10.1016/j.susc.2003.10.002
 
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