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Hattori, N., Hirai, M., Kusaka, M., Iwami, M. (2003) Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy. Applied Surface Science, 216. 54-58 doi:10.1016/s0169-4332(03)00498-7

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy
JournalApplied Surface Science
AuthorsHattori, N.Author
Hirai, M.Author
Kusaka, M.Author
Iwami, M.Author
Year2003 (June)Volume216
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00498-7Search in ResearchGate
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Mindat Ref. ID9905346Long-form Identifiermindat:1:5:9905346:2
GUID0
Full ReferenceHattori, N., Hirai, M., Kusaka, M., Iwami, M. (2003) Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy. Applied Surface Science, 216. 54-58 doi:10.1016/s0169-4332(03)00498-7
Plain TextHattori, N., Hirai, M., Kusaka, M., Iwami, M. (2003) Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy. Applied Surface Science, 216. 54-58 doi:10.1016/s0169-4332(03)00498-7
In(n.d.) Applied Surface Science Vol. 216. Elsevier BV

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Hirai, M., Marumoto, Y., Kusaka, M., Iwami, M., Ozawa, T., Nagamura, T., Nakata, T. (1997) Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy. Applied Surface Science, 113. 360-363 doi:10.1016/s0169-4332(96)00904-x
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Jikimoto, T., Wang, J.L., Saito, T., Hirai, M., Kusaka, M., Iwami, M., Nakata, T. (1998) Atomic and electronic structures of heat treated 6H–SiC surface. Applied Surface Science, 130. 593-597 doi:10.1016/s0169-4332(98)00121-4
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