Kobayashi, Naoki, Kobayashi, Yasuyuki (2000) In-situ optical monitoring of surface morphology and stoichiometry during GaN metal organic vapor phase epitaxy. Applied Surface Science, 159. 398-404 doi:10.1016/s0169-4332(00)00116-1
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | In-situ optical monitoring of surface morphology and stoichiometry during GaN metal organic vapor phase epitaxy | ||
Journal | Applied Surface Science | ||
Authors | Kobayashi, Naoki | Author | |
Kobayashi, Yasuyuki | Author | ||
Year | 2000 (June) | Volume | 159 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(00)00116-1Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9901954 | Long-form Identifier | mindat:1:5:9901954:7 |
GUID | 0 | ||
Full Reference | Kobayashi, Naoki, Kobayashi, Yasuyuki (2000) In-situ optical monitoring of surface morphology and stoichiometry during GaN metal organic vapor phase epitaxy. Applied Surface Science, 159. 398-404 doi:10.1016/s0169-4332(00)00116-1 | ||
Plain Text | Kobayashi, Naoki, Kobayashi, Yasuyuki (2000) In-situ optical monitoring of surface morphology and stoichiometry during GaN metal organic vapor phase epitaxy. Applied Surface Science, 159. 398-404 doi:10.1016/s0169-4332(00)00116-1 | ||
In | (n.d.) Applied Surface Science Vol. 159. Elsevier BV |
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