Vote for your favorite mineral in #MinCup25! - Stibnite vs. Okenite
It's a battle of dark and light as soft, dramatic stibnite goes up against adorable cottonballs of Okenite.
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Fares, B., Dubois, C., Gautier, B., Dupuy, J.C., Cayrel, F., Gaudin, G. (2006) AFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size. Applied Surface Science, 252. 6448-6451 doi:10.1016/j.apsusc.2006.02.253

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleAFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size
JournalApplied Surface Science
AuthorsFares, B.Author
Dubois, C.Author
Gautier, B.Author
Dupuy, J.C.Author
Cayrel, F.Author
Gaudin, G.Author
Year2006 (July)Volume252
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2006.02.253Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9908596Long-form Identifiermindat:1:5:9908596:6
GUID0
Full ReferenceFares, B., Dubois, C., Gautier, B., Dupuy, J.C., Cayrel, F., Gaudin, G. (2006) AFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size. Applied Surface Science, 252. 6448-6451 doi:10.1016/j.apsusc.2006.02.253
Plain TextFares, B., Dubois, C., Gautier, B., Dupuy, J.C., Cayrel, F., Gaudin, G. (2006) AFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size. Applied Surface Science, 252. 6448-6451 doi:10.1016/j.apsusc.2006.02.253
In(n.d.) Applied Surface Science Vol. 252. Elsevier BV

See Also

These are possibly similar items as determined by title/reference text matching only.

Fares, B., Gautier, B., Dupuy, J.C., Prudon, G., Holliger, P. (2006) Deconvolution of very low primary energy SIMS depth profiles. Applied Surface Science, 252. 6478-6481 doi:10.1016/j.apsusc.2006.02.069
Fares, B., Gautier, B., Baboux, N., Prudon, G., Holliger, P., Dupuy, J.C. (2004) Influence of surface orientation on the formation of sputtering-induced ripple topography in silicon. Applied Surface Science, 231. 678-683 doi:10.1016/j.apsusc.2004.03.178
Fares, B., Gautier, B., Holliger, Ph., Baboux, N., Prudon, G., Dupuy, J.-Cl. (2006) Surface roughening and erosion rate change at low energy SIMS depth profiling of silicon during oblique bombardment. Applied Surface Science, 253. 2662-2670 doi:10.1016/j.apsusc.2006.05.034
Dubois, Christiane, Prudon, Gilles, Gautier, Brice, Dupuy, Jean-Claude (2008) Quantitative SIMS measurement of high concentration of boron in silicon (up to 20at.%) using an isotopic comparative method. Applied Surface Science, 255. 1377-1380 doi:10.1016/j.apsusc.2008.05.051
Gautier, Brice, Fares, Boubker, Prudon, Gilles, Dupuy, Jean-Claude (2004) Imaging by atomic force microscopy of the electrical properties difference of the facets of oxygen-ion-induced ripple topography in silicon. Applied Surface Science, 231. 136-140 doi:10.1016/j.apsusc.2004.03.095
Gao, F., Wang, Y., Cao, G., Jia, X., Zhang, F. (2006) Reduction of sidewall roughness in silicon-on-insulator rib waveguides. Applied Surface Science, 252. 5071-5075 doi:10.1016/j.apsusc.2005.07.070
Lescop, B. (2006) Initial oxidation of Mn surface studied by ultraviolet photoelectron spectroscopy and metastable induced electron spectroscopy. Applied Surface Science, 252. 2276-2280 doi:10.1016/j.apsusc.2005.04.003
Gautier, B., Dupuy, J.C., Semmache, B., Prudon, G. (1998) SIMS depth profile correction for the study of the first step of the diffusion of boron in silicon. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 142 (3). 361-376 doi:10.1016/s0168-583x(98)00238-9
Dupuy, J.C., Prudon, G., Dubois, C., Warren, P., Dutartre, D. (1994) Depth resolution in SIMS study of boron δ-doping in epitaxial silicon. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 85 (1). 379-382 doi:10.1016/0168-583x(94)95848-3
Boulsina, F., Berrabah, M., Dupuy, J.C. (2008) Deconvolution of SIMS depth profiles: Towards simple and faster techniques. Applied Surface Science, 255. 1946-1958 doi:10.1016/j.apsusc.2008.06.124
Fares, B., Gautier, B., Albertini, D., Mzerd, A., Loghmarti, M. (2014) Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis. Applied Surface Science, 308. 24-30 doi:10.1016/j.apsusc.2014.04.054
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 2, 2025 19:22:53
Go to top of page