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Fares, B., Gautier, B., Albertini, D., Mzerd, A., Loghmarti, M. (2014) Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis. Applied Surface Science, 308. 24-30 doi:10.1016/j.apsusc.2014.04.054

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Reference TypeJournal (article/letter/editorial)
TitleImaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis
JournalApplied Surface Science
AuthorsFares, B.Author
Gautier, B.Author
Albertini, D.Author
Mzerd, A.Author
Loghmarti, M.Author
Year2014 (July)Volume308
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2014.04.054Search in ResearchGate
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Mindat Ref. ID9923009Long-form Identifiermindat:1:5:9923009:8
GUID0
Full ReferenceFares, B., Gautier, B., Albertini, D., Mzerd, A., Loghmarti, M. (2014) Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis. Applied Surface Science, 308. 24-30 doi:10.1016/j.apsusc.2014.04.054
Plain TextFares, B., Gautier, B., Albertini, D., Mzerd, A., Loghmarti, M. (2014) Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis. Applied Surface Science, 308. 24-30 doi:10.1016/j.apsusc.2014.04.054
In(n.d.) Applied Surface Science Vol. 308. Elsevier BV

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