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Nietzold, C., Dietrich, P.M., Holzweber, M., Lippitz, A., Kamalakumar, A., Blanchard, V., Ivanov-Pankov, S., Weigel, W., Panne, U., Unger, W.E.S. (2018) Surface chemical characterization of model glycan surfaces and shelf life studies of glycan microarrays using XPS, NEXAFS spectroscopy, ToF-SIMS and fluorescence scanning. Applied Surface Science, 459. 860-873 doi:10.1016/j.apsusc.2018.07.133

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Reference TypeJournal (article/letter/editorial)
TitleSurface chemical characterization of model glycan surfaces and shelf life studies of glycan microarrays using XPS, NEXAFS spectroscopy, ToF-SIMS and fluorescence scanning
JournalApplied Surface Science
AuthorsNietzold, C.Author
Dietrich, P.M.Author
Holzweber, M.Author
Lippitz, A.Author
Kamalakumar, A.Author
Blanchard, V.Author
Ivanov-Pankov, S.Author
Weigel, W.Author
Panne, U.Author
Unger, W.E.S.Author
Year2018 (November)Volume459
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2018.07.133Search in ResearchGate
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Mindat Ref. ID9935543Long-form Identifiermindat:1:5:9935543:0
GUID0
Full ReferenceNietzold, C., Dietrich, P.M., Holzweber, M., Lippitz, A., Kamalakumar, A., Blanchard, V., Ivanov-Pankov, S., Weigel, W., Panne, U., Unger, W.E.S. (2018) Surface chemical characterization of model glycan surfaces and shelf life studies of glycan microarrays using XPS, NEXAFS spectroscopy, ToF-SIMS and fluorescence scanning. Applied Surface Science, 459. 860-873 doi:10.1016/j.apsusc.2018.07.133
Plain TextNietzold, C., Dietrich, P.M., Holzweber, M., Lippitz, A., Kamalakumar, A., Blanchard, V., Ivanov-Pankov, S., Weigel, W., Panne, U., Unger, W.E.S. (2018) Surface chemical characterization of model glycan surfaces and shelf life studies of glycan microarrays using XPS, NEXAFS spectroscopy, ToF-SIMS and fluorescence scanning. Applied Surface Science, 459. 860-873 doi:10.1016/j.apsusc.2018.07.133
In(n.d.) Applied Surface Science Vol. 459. Elsevier BV

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